Self-test system for application-specific integrated circuit (asic) devices

A system for on-demand Logic Built-In Self-Test (LBIST), the system comprising:

• a host device;
• a memory device comprising:
• a storage component configured to store LBIST pattern seed information;
• an In-System Test (IST) controller coupled to the storage component configured to:
• receive a command from the host device to initiate a self-test operation;
• in response to receiving the command, load first pattern seed information from the storage component;
• and
• trigger execution of the self-test operation using the first pattern seed information from the storage component;
• and
• upon completion of the self-test operation, provide LBIST status information to the host device;
• and
• an interface coupling the host device and the memory device.

A method for performing on-demand Logic Built-In Self-Test (LBIST) in a memory device, the method comprising:

• receiving, by an In-System Test (IST) controller, a host command to initiate an LBIST operation during functional operation of the memory device;
• loading, by the IST controller, LBIST pattern seed information into a storage component of the memory device in response to the host command;
• executing the LBIST operation using the LBIST pattern seed information from the storage component;
• generating a test signature based on results of the LBIST operation;
• providing LBIST status information to the host device upon completion of the LBIST operation, wherein the LBIST status information is based on the test signature.