G01R 31/31718
Logistic aspects
Official title: {Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis (mechanical aspects G01R31/2808, G01R31/2851)}
G01R31/31718 (Logistic aspects) appears on 276 US grants and 278 published applications in this corpus.
Search patents in G01R- Granted patents
- 276
- Published applications
- 278
- Assignees
- 122
- Inventors
- 648
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 1 |
| 2002 | 3 | 3 |
| 2003 | 4 | 7 |
| 2004 | 6 | 15 |
| 2005 | 9 | 25 |
| 2006 | 19 | 20 |
| 2007 | 21 | 24 |
| 2008 | 20 | 18 |
| 2009 | 18 | 11 |
| 2010 | 20 | 10 |
| 2011 | 4 | 6 |
| 2012 | 7 | 3 |
| 2013 | 9 | 10 |
| 2014 | 4 | 12 |
| 2015 | 6 | 9 |
| 2016 | 8 | 8 |
| 2017 | 16 | 13 |
| 2018 | 13 | 9 |
| 2019 | 8 | 11 |
| 2020 | 14 | 16 |
| 2021 | 15 | 16 |
| 2022 | 11 | 5 |
| 2023 | 12 | 7 |
| 2024 | 10 | 11 |
| 2025 | 8 | 5 |
| 2026 | 2 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for automating testing of system under test (SUT)28 Jul 2026US 12,693,329 B1Keysight Technologies, Inc.
- Method, device, and system for detecting fuse configuration for trimming circuit21 Jul 2026US 12,687,577 B2Samsung Electronics Co., Ltd.
- System and method of monitoring performance of an electronic device30 Dec 2025US 12,510,594 B2Samsung Electronics Co., Ltd.
- Pattern generation system with pin function mapping23 Dec 2025US 12,504,470 B2Yangtze Memory Technologies Co., Ltd.
- Software defined device variants9 Sep 2025US 12,411,168 B2Xilinx, Inc.
- Methods, systems, and computer readable media for testing the performance and reliability of a device or system under test (sut) using real and emulated processing ranks within a data center environment18 Jun 2026US 2026/0169064 A1Keysight Technologies, Inc.
- Machine learning tools for analyzing semiconductor yield analysis and diagnosis data11 Jun 2026US 2026/0160804 A1Xilinx, Inc.
- System for testing semiconductors and corresponding test method16 Apr 2026US 2026/0104445 A1STMicroelectronics International N. V.
- Semiconductor device and failure analysis method therefor25 Dec 2025US 2025/0389773 A1Renesas Electronics Corporation
- Circuit input/output (i/o) test system28 Aug 2025US 2025/0271501 A1
Most cited
By later US patents
- System and apparatus for using test structures inside of a chip during the fabrication of the chip108US 7,256,055 B2tau-Metrix, Inc. · 2007
- System and apparatus for using test structures inside of a chip during the fabrication of the chip92US 7,736,916 B2tau-Metrix, Inc. · 2010
- Test structures for evaluating a fabrication of a die or a wafer89US 8,344,745 B2tau-Metrix, Inc. · 2013
- Method of sorting a group of integrated circuit devices for those devices requiring special testing86US 5,844,803 AMicron Technology, Inc. · 1998
- Method for continuous, non lot-based integrated circuit manufacturing64US 5,856,923 AMicron Technology, Inc. · 1999