Software defined device variants
AssigneeXilinx, Inc.
InventorsDinesh D. Gaitonde, Matthew H. Klein, Himanshu Verma, Chirag Ravishankar, Maithilee Rajendra Kulkarni
Life of this patent
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Abstract
Embodiments herein describe assigning integrated circuits with defects as variants of the integrated circuit design. Each variant can deactivate different circuitry in the integrated circuit design. A location of the defect can be matched to a variant that has a deactivated region that covers the defect. The integrated circuit can then be assigned to that variant.
Claims20
A method, comprising:
- identifying a defect in an integrated circuit (IC);
- identifying a first variant of a plurality of predefined variants of the IC that includes a predefined deactivated region that covers the defect, wherein each of the plurality of predefined variants includes a plurality of predefined deactivated regions that are non-contiguous, wherein a size of each of the plurality of predefined deactivated regions permits signals to be routed through each of the plurality of predefined deactivated regions;
- and
- assigning the IC to the first variant.
A system, comprising:
- processor;
- and
- memory storing an application which, when executed by the processor, performs an operation, the operation comprising:
- identifying a defect in an integrated circuit (IC);
- identifying a first variant of a plurality of predefined variants of the IC that includes a predefined deactivated region that covers the defect, wherein each of the plurality of predefined variants includes a plurality of predefined deactivated regions that are non-contiguous, wherein a size of each of the plurality of predefined deactivated regions permits signals to be routed through each of the plurality of predefined deactivated regions;
- and
- assigning the IC to the first variant.
A non-transitory computer readable storage medium encoding instructions, which, when executed by a processor, perform an operation, the operation comprising:
- identifying a defect in an integrated circuit (IC);
- identifying a first variant of a plurality of predefined variants of the IC that includes a predefined deactivated region that covers the defect, wherein each of the plurality of predefined variants includes a plurality of predefined deactivated regions that are non-contiguous, wherein a size of each of the plurality of predefined deactivated regions permits signals to be routed through each of the plurality of predefined deactivated regions;
- and
- assigning the IC to the first variant.
Dependencies are inferred from the claim text.