System for testing semiconductors and corresponding test method

A method of testing semiconductor devices via a probing array including individual cells configured to co-operate with semiconductor devices under test where the individual cells in the probing array are arranged in cell clusters, the method comprising:

• establishing electrical contact of individual cells in the probing array with semiconductor devices under test;
• selectively applying via the individual cells in the probing array electrical stimulation signals to the semiconductor device under test;
• detecting a fault condition in the semiconductor device under test based on electrical reaction signals received from the semiconductor device under test in response to said electrical stimulation signals;
• temporarily disabling the individual cells in the probing array in response to the fault condition detected in the respective semiconductor device under test;
• issuing from said cell clusters in the probing array respective alert signals indicative of the fault condition detected in at least one individual cell therein;
• and
• performing, based on said alert signals, a query of individual cells in the probing array and identifying individual cells in the probing array where the fault condition is detected in the respective semiconductor device under test.