Method, device, and system for detecting fuse configuration for trimming circuit

A test device for generating a fuse configuration for trimming a circuit, the test device comprising:

• an evaluation module configured to evaluate characteristics, corresponding to each of a plurality of fuse configurations, of the circuit trimmed based on the plurality of fuse configurations respectively;
• a selection module configured to select at least one fuse configuration from among the plurality of fuse configurations, based on a result of evaluating the characteristics of the circuit;
• a contribution module configured to calculate contribution information by calculating a degree of influence of fuse data of each of the plurality of fuse configurations to characteristics of the circuit, based on the plurality of fuse configurations and the characteristics;
• and
• a variation module configured to generate at least one new fuse configuration, based on the selected at least one fuse configuration and the contribution information.

A system comprising:

• a semiconductor device configured to:
• receive a plurality of fuse configurations;
• and
• output characteristics, corresponding to each of the plurality of fuse configurations, of the semiconductor device that is trimmed respectively according to the plurality of fuse configurations;
• and
• a test device configured to:
• generate at least one new fuse configuration, based on the plurality of fuse configurations and the characteristics of the semiconductor device;
• and
• provide the at least one new fuse configuration to the semiconductor device,
• wherein the test device is further configured to:
• evaluate the characteristics of the semiconductor device trimmed based on the plurality of fuse configurations respectively,
• select at least one fuse configuration from among the plurality of fuse configurations, based on a result of evaluating the characteristics of the semiconductor device,
• calculate contribution information by calculating a degree of influence of fuse data of each of the plurality of fuse configurations to the characteristics of the semiconductor device, based on the plurality of fuse configurations and the characteristics of the semiconductor device, and
• generate at least one new fuse configuration, based on the selected at least one fuse configuration and the contribution information.