G01R 31/3172
Optimisation aspects
Official title: {Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing}
G01R31/3172 (Optimisation aspects) appears on 270 US grants and 292 published applications in this corpus.
Search patents in G01R- Granted patents
- 270
- Published applications
- 292
- Assignees
- 107
- Inventors
- 407
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2001 | 0 | 2 |
| 2002 | 1 | 1 |
| 2003 | 3 | 7 |
| 2004 | 6 | 15 |
| 2005 | 9 | 11 |
| 2006 | 9 | 19 |
| 2007 | 15 | 16 |
| 2008 | 13 | 10 |
| 2009 | 10 | 14 |
| 2010 | 13 | 10 |
| 2011 | 12 | 15 |
| 2012 | 16 | 10 |
| 2013 | 14 | 18 |
| 2014 | 11 | 13 |
| 2015 | 11 | 13 |
| 2016 | 17 | 27 |
| 2017 | 17 | 18 |
| 2018 | 20 | 13 |
| 2019 | 12 | 12 |
| 2020 | 12 | 8 |
| 2021 | 12 | 17 |
| 2022 | 10 | 6 |
| 2023 | 12 | 8 |
| 2024 | 10 | 6 |
| 2025 | 3 | 1 |
| 2026 | 2 | 2 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- System and method for schedule-based I/O multiplexing for integrated circuit (IC) scan test14 Jul 2026US 12,681,084 B1Marvell Asia Pte Ltd
- Multiple test modes for a memory in an integrated circuit3 Mar 2026US 12,567,476 B2SambaNova Systems, Inc.
- Electronic device for improving a performance of a signal chain25 Nov 2025US 12,480,991 B2Rohde & Schwarz GmbH & Co.KG
- Scan testing using scan frames with embedded commands11 Nov 2025US 12,467,971 B2Texas Instruments Incorporated
- Test circuit in chip and circuit test method20 May 2025US 12,306,244 B2Huawei Technologies Co., Ltd.
- Scan-path integrated circuit memory with output bus feedback9 Jul 2026US 2026/0196286 A1SambaNova Systems, Inc.
- System and method for debugging clb logic element states using only one pin21 May 2026US 2026/0140175 A1Microchip Technology Incorporated
- Ai embedding vector data base calibration architecture4 Dec 2025US 2025/0370039 A1
- Generating a test program26 Dec 2024US 2024/0426906 A1Teradyne, Inc.
- Electronic device for improving a performance of a signal chain12 Dec 2024US 2024/0410942 A1Rohde & Schwarz GmbH & Co.KG
Most cited
By later US patents
- Structured integrated circuit device266US 7,157,937 B2eASIC Corporation · 2007
- Structured integrated circuit device263US 7,098,691 B2eASIC Corporation · 2006
- Semiconductor chip repair by stacking of a base semiconductor chip and a repair semiconductor chip182US 8,679,861 B2International Business Machines Corporation · 2014
- Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the same98US 7,002,364 B2Hynix Semiconductor Inc. · 2006
- Method and apparatus for log information management and reporting23US 6,539,341 B13Com Corporation · 2003