System and method for debugging clb logic element states using only one pin
AssigneeMicrochip Technology Incorporated
InventorsAttila Kolinger, Josh Booth
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicrochip Technology Incorporated
InventorsAttila Kolinger, Josh Booth
Estimating the term…
A system and method for debugging logic elements in a configurable logic block using only one pin. A synchronization pulse is generated, and each logic element is connected, in turn, using a digital selector switch. The synchronization pulse and a logic state of each logic element are received, in turn, by an output buffer. First, second, and third digital outputs levels are enabled on a single output line using a voltage divider configuration of resistors connected to the output line of the output buffer. The output levels include the synchronization pulse, a low logic state, and a high logic state. The synchronization pulse and the logic state of each logic element are outputted as the different output levels, in turn, via a single debug pin connected to an oscilloscope or other display device for visualization. The debug pin may be shared with other functions when not being used for debugging.
A system for debugging a plurality of logic elements in a field-programmable gate array, wherein each logic element of the plurality of logic elements is associated with a particular logic state, the system comprising:
A method for debugging a plurality of logic elements in a field-programmable gate array, wherein each logic element of the plurality of logic elements is associated with a particular logic state, the method comprising:
A method of debugging a plurality of logic elements in a configurable logic block, wherein the plurality of logic elements includes between twenty-eight (28) and one hundred thirty-two (132) logic elements, and wherein each logic element of the plurality of logic elements is associated with a particular logic state, the method comprising:
Dependencies are inferred from the claim text.