G01R 31/31705
Debugging aspects
Official title: {Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits (generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544)}
G01R31/31705 (Debugging aspects) appears on 511 US grants and 491 published applications in this corpus.
Search patents in G01R- Granted patents
- 511
- Published applications
- 491
- Assignees
- 188
- Inventors
- 990
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 4 | 0 |
| 1999 | 3 | 0 |
| 2000 | 6 | 0 |
| 2001 | 8 | 6 |
| 2002 | 10 | 20 |
| 2003 | 9 | 10 |
| 2004 | 19 | 23 |
| 2005 | 20 | 14 |
| 2006 | 18 | 27 |
| 2007 | 18 | 14 |
| 2008 | 13 | 14 |
| 2009 | 22 | 17 |
| 2010 | 25 | 20 |
| 2011 | 25 | 9 |
| 2012 | 17 | 12 |
| 2013 | 19 | 14 |
| 2014 | 23 | 28 |
| 2015 | 21 | 38 |
| 2016 | 29 | 39 |
| 2017 | 28 | 30 |
| 2018 | 32 | 26 |
| 2019 | 21 | 26 |
| 2020 | 28 | 18 |
| 2021 | 26 | 16 |
| 2022 | 12 | 20 |
| 2023 | 12 | 10 |
| 2024 | 13 | 15 |
| 2025 | 15 | 11 |
| 2026 | 8 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Memory, memory system and method of controlling storage device16 Jun 2026US 12,656,394 B2Kioxia Corporation
- Real-time debug in low-power devices2 Jun 2026US 12,644,922 B2STMicroelectronics International N. V.
- Single signal debug port2 Jun 2026US 12,645,528 B2STMicroelectronics International N. V.
- Providing configurable security for intellectual property circuits of a processor14 Apr 2026US 12,601,785 B2Intel Corporation
- Systems and methods for debugging multi-core processors with configurable isolated partitions14 Apr 2026US 12,602,279 B2NXP USA, Inc.
- Semiconductor devices configured for repairing defective bumps8 Oct 2026US 2026/0309777 A1SK hynix Inc.
- Memory, memory system and method of controlling storage device24 Sep 2026US 2026/0287653 A1Kioxia Corporation
- Unified test and debug chiplet architecture17 Sep 2026US 2026/0276704 A1Intel Corporation
- Measurement device10 Sep 2026US 2026/0266901 A1Sony Semiconductor Solutions Corporation
- Configurable test circuit10 Sep 2026US 2026/0266903 A1Hewlett Packard Enterprise Development LP
Most cited
By later US patents
- Microcontroller provided with hardware for supporting debugging as based on boundary scan standard-type extensions210US 5,590,354 AU. S. Philips Corporation · 1996
- Microprocessor with an external command mode for diagnosis and debugging197US 5,479,652 AIntel Corporation · 1995
- Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin152US 5,771,240 AHewlett-Packard Company · 1998
- Method for debugging an integrated circuit using extended operating modes95US 5,828,824 ATexas Instruments Incorporated · 1998
- Method and apparatus for providing optimized access to circuits for debug, programming, and test89US 6,594,802 B1Intellitech Corporation · 2003