Measurement device
AssigneeSony Semiconductor Solutions Corporation
InventorsNORIHITO SUZUKI, HIROAKI FUJITA
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Abstract
The present disclosure relates to a measurement device capable of taking measurements more accurately. A measurement device is provided, the measurement device including: a PLL circuit used in common to generate both a transmission RF signal and a reception LO signal that are high-frequency signals at different frequencies; an IQ correction unit that corrects IQ error in an LO signal used to generate at least one of the transmission RF signal or the reception LO signal; and a switching unit that switches between an on state in which correction by the IQ correction unit is performed and an off state in which the correction is not performed. The present disclosure can be applied in a vector network analyzer, for example.
Claims11
A measurement device comprising:
- a Phase Locked Loop (PLL) circuit used in common to generate both a transmission Radio Frequency (RF) signal and a reception Local Oscillator (LO) signal that are high-frequency signals at different frequencies;
- an IQ correction unit that corrects IQ error in an LO signal used to generate at least one of the transmission RF signal or the reception LO signal;
- and
- a switching unit that switches between an on state in which correction by the IQ correction unit is performed and an off state in which the correction is not performed.
Dependencies are inferred from the claim text.