Method for debugging an integrated circuit using extended operating modes
AssigneeTexas Instruments Incorporated
InventorGary L. Swoboda
Life of this patent
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Abstract
A method of testing an integrated circuit 104 which may have multiple modules 204a-d is provided. Target interface 200 provides an interface for connecting target system 104 to a test system which is an extension of IEEE 1149.1. Target system 104 may have multiple devices 202, each having multiple modules 204. Each device 202 has device interface 210 which connects to target interface 200. Decoder 1020 decodes certain signals from interface 200 to enable Extended Operating Modes which allow test codes to be easily directed to any one of modules 204a-d. Hardware and software debugging of system 104 is aided by interface 200 and production testing of system 104 is simplified.
Claims7
A method of testing an integrated circuit having a target system debug interface which has a plurality of device debug interface terminals, comprising:
- selecting a first extended operation mode from a plurality of combinational extended operating modes by placing a first pattern of signals on said target system debug interface;
- operating said integrated circuit according to said selected combinational extended operating mode;
- selecting a second extended operation mode from a plurality of latched extended operating modes by placing a second pattern of signals on said target system debug interface;
- and
- operating said integrated circuit according to said selected latched extended operating mode in response to said second pattern of signals.
A method of designing an integrated circuit having a target system debug interface, comprising:
- providing a library of device modules which each have a common device debug interface;
- selecting a plurality of said device modules for said integrated circuit and connecting said device interface of each of said selected device modules in parallel to said target system debug interface;
- and
- providing decode circuitry to select each of said device modules included in said integrated circuit for debug operations in response to a predetermined code placed on said target system debug interface.
Dependencies are inferred from the claim text.