G01R 31/3181
Functional testing
Official title: Functional testing (G01R31/3177 takes precedence)
G01R31/3181 (Functional testing) appears on 12,294 US grants and 9,297 published applications in this corpus.
Search patents in G01R- Granted patents
- 12,294
- Published applications
- 9,297
- Assignees
- 1,700
- Inventors
- 16,849
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 14 | 0 |
| 1977 | 21 | 0 |
| 1978 | 14 | 0 |
| 1979 | 13 | 0 |
| 1980 | 20 | 0 |
| 1981 | 24 | 0 |
| 1982 | 22 | 0 |
| 1983 | 19 | 0 |
| 1984 | 29 | 0 |
| 1985 | 59 | 0 |
| 1986 | 47 | 0 |
| 1987 | 94 | 0 |
| 1988 | 84 | 0 |
| 1989 | 107 | 0 |
| 1990 | 87 | 0 |
| 1991 | 87 | 0 |
| 1992 | 106 | 0 |
| 1993 | 102 | 0 |
| 1994 | 135 | 0 |
| 1995 | 196 | 0 |
| 1996 | 227 | 0 |
| 1997 | 241 | 0 |
| 1998 | 308 | 0 |
| 1999 | 307 | 0 |
| 2000 | 298 | 0 |
| 2001 | 322 | 88 |
| 2002 | 360 | 394 |
| 2003 | 423 | 458 |
| 2004 | 447 | 492 |
| 2005 | 377 | 576 |
| 2006 | 491 | 560 |
| 2007 | 520 | 561 |
| 2008 | 515 | 575 |
| 2009 | 524 | 509 |
| 2010 | 557 | 429 |
| 2011 | 516 | 378 |
| 2012 | 345 | 296 |
| 2013 | 402 | 346 |
| 2014 | 372 | 348 |
| 2015 | 341 | 357 |
| 2016 | 339 | 311 |
| 2017 | 330 | 282 |
| 2018 | 289 | 274 |
| 2019 | 325 | 260 |
| 2020 | 293 | 286 |
| 2021 | 305 | 300 |
| 2022 | 279 | 281 |
| 2023 | 320 | 270 |
| 2024 | 268 | 282 |
| 2025 | 243 | 226 |
| 2026 | 130 | 158 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- I3C error states test strategy6 Oct 2026US 12,754,235 B2Microchip Technology Incorporated
- Data correction and phase optimization in high-speed receivers6 Oct 2026US 12,754,237 B2Diodes Incorporated
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus29 Sep 2026US 12,748,144 B2Advantest Corporation
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Solderless high current, high voltage, high bandwidth test fixture22 Sep 2026US 12,742,819 B2Keithley Instruments, LLC
- Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Test and Diagnosis8 Oct 2026US 2026/0309778 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Jtag-based soc design verification on emulation1 Oct 2026US 2026/0299020 A1Microsoft Technology Licensing, LLC
- Multi-phase synchronized method for lane margining1 Oct 2026US 2026/0299021 A1SK hynix Inc.
- Methods, systems, and computer readable media for providing a test system with emulation modeling1 Oct 2026US 2026/0299022 A1Keysight Technologies, Inc.
- Testing large-scale electronic systems constituted of many functional blocks1 Oct 2026US 2026/0299023 A1Krivya Semicon Private Limited
Most cited
By later US patents
- User programmable integrated circuit interconnect architecture and test method471US 4,758,745 AActel Corporation · 1988
- Method and apparatus for providing attribute nodes in a graphical data flow environment448US 5,481,741 ANational Instruments Corporation · 1996
- Correlation of electrical test data with physical defect data433US 6,950,771 B1Xilinx, Inc. · 2005
- Source synchronous link integrity validation423US 6,965,648 B1Sun Microsystems, Inc. · 2005
- System and method for comparing values from target systems419US 6,578,058 B1Agilent Technologies, Inc. · 2003