G01R 31/319
Tester hardware, i.e. output processing circuits
G01R31/319 (Tester hardware, i.e. output processing circuits) appears on 4,148 US grants and 3,163 published applications in this corpus.
Search patents in G01R- Granted patents
- 4,148
- Published applications
- 3,163
- Assignees
- 873
- Inventors
- 6,619
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 5 | 0 |
| 1977 | 10 | 0 |
| 1978 | 9 | 0 |
| 1979 | 9 | 0 |
| 1980 | 12 | 0 |
| 1981 | 14 | 0 |
| 1982 | 13 | 0 |
| 1983 | 11 | 0 |
| 1984 | 16 | 0 |
| 1985 | 29 | 0 |
| 1986 | 23 | 0 |
| 1987 | 46 | 0 |
| 1988 | 38 | 0 |
| 1989 | 48 | 0 |
| 1990 | 28 | 0 |
| 1991 | 32 | 0 |
| 1992 | 42 | 0 |
| 1993 | 43 | 0 |
| 1994 | 48 | 0 |
| 1995 | 62 | 0 |
| 1996 | 62 | 0 |
| 1997 | 74 | 0 |
| 1998 | 104 | 0 |
| 1999 | 120 | 0 |
| 2000 | 122 | 0 |
| 2001 | 115 | 36 |
| 2002 | 157 | 149 |
| 2003 | 167 | 174 |
| 2004 | 154 | 179 |
| 2005 | 126 | 236 |
| 2006 | 185 | 227 |
| 2007 | 187 | 193 |
| 2008 | 183 | 202 |
| 2009 | 178 | 175 |
| 2010 | 175 | 133 |
| 2011 | 128 | 126 |
| 2012 | 93 | 61 |
| 2013 | 100 | 73 |
| 2014 | 96 | 92 |
| 2015 | 72 | 96 |
| 2016 | 82 | 77 |
| 2017 | 84 | 78 |
| 2018 | 89 | 94 |
| 2019 | 83 | 72 |
| 2020 | 106 | 112 |
| 2021 | 108 | 112 |
| 2022 | 101 | 118 |
| 2023 | 124 | 102 |
| 2024 | 88 | 111 |
| 2025 | 98 | 88 |
| 2026 | 49 | 47 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Solderless high current, high voltage, high bandwidth test fixture22 Sep 2026US 12,742,819 B2Keithley Instruments, LLC
- Test control device and operating method thereof8 Sep 2026US 12,730,152 B2Lite-On Technology Corporation
- Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support1 Sep 2026US 12,724,065 B1Synopsys, Inc.
- Semiconductor test apparatus and power supply method thereof1 Sep 2026US 12,724,067 B2Samsung Electronics Co., Ltd.
- Testing large-scale electronic systems constituted of many functional blocks1 Oct 2026US 2026/0299023 A1Krivya Semicon Private Limited
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- Common debug network for chiplet and multi-chipset architectures3 Sep 2026US 2026/0259259 A1QUALCOMM Incorporated
- System and method for signal timing error correction3 Sep 2026US 2026/0259264 A1Rohde & Schwarz GmbH & Co.KG
- Portable device and method for performing multiple tests on an electronic circuit20 Aug 2026US 2026/0243825 A1
Most cited
By later US patents
- Method and apparatus for providing attribute nodes in a graphical data flow environment448US 5,481,741 ANational Instruments Corporation · 1996
- System and method for comparing values from target systems419US 6,578,058 B1Agilent Technologies, Inc. · 2003
- Graphical system for modelling a process and associated method373US 4,901,221 ANational Instruments Corporation · 1990
- System and method for dynamically controlling remote processes from a performance monitor343US 5,432,932 AInternational Business Machines Corporation · 1995
- Graphical system for modelling a process and associated method330US 4,914,568 ANational Instruments Corporation · 1990