Test control device and operating method thereof
AssigneeLite-On Technology Corporation
InventorJin-Jye Chou
Life of this patent
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Abstract
A test control device and an operating method thereof are disclosed. The test control device includes a voltage generator and a data processor. The voltage generator is coupled to a device under test which is a universal serial bus interface through a first connector. The voltage generator is configured to generate a supply voltage to the device under test. The data processor receives a test signal sent by an external electronic device through a second connector. The data processor forwards the test signal to the device under test through the first connector. The processor receives a test feedback data from the device under test through the first connector.
Claims16
A test control device, comprising:
- a voltage generator coupled to a device under test as a Universal Serial Bus (USB) interface through a first connector, the voltage generator configured to generate a supply voltage to the device under test;
- a data processor coupled to the first connector and a second connector, wherein the data processor receives a test signal sent by an external electronic device through the second connector, the data processor forwards the test signal to the device under test through the first connector, and the data processor receives a test feedback data from the device under test through the first connector;
- and
- a power delivery (PD) controller coupled to the voltage generator and a configuration channel (CC) pin of the first connector, configured to detect whether the device under test has a charging mode supporting a PD protocol through the CC pin of the first connector, wherein
- when the PD controller detects that the device under test has the charging mode supporting the PD protocol, the voltage generator selects a candidate voltage from a plurality of candidate voltages as the supply voltage through the PD controller, and provides the supply voltage to the device under test.
An operating method of a test control device, comprising:
- enabling a voltage generator to be coupled to a device under test as a Universal Serial Bus (USB) interface through a first connector, and enabling the voltage generator to generate a supply voltage to the device under test;
- enabling a data processor to receive a test signal sent by an external electronic device through a second connector;
- enabling the data processor to forward the test signal to the device under test through the first connector;
- enabling the data processor to receive a test feedback data from the device under test through the first connector;
- providing a power delivery (PD) controller, and enabling the PD controller to detect whether the device under test has a charging mode supporting a PD protocol through a configuration channel (CC) pin of the first connector;
- and
- when the PD controller detects that the device under test has the charging mode supporting the PD protocol, enabling the voltage generator to select a candidate voltage from a plurality of candidate voltages as the supply voltage through the PD controller, and enabling the PD controller to provide the supply voltage to the device under test.
Dependencies are inferred from the claim text.