G01R 31/31903
Tester configuration
Official title: {tester configuration}
G01R31/31903 (Tester configuration) appears on 1,839 US grants and 1,409 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,839
- Published applications
- 1,409
- Assignees
- 564
- Inventors
- 3,494
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 2 | 0 |
| 1978 | 4 | 0 |
| 1979 | 5 | 0 |
| 1980 | 4 | 0 |
| 1981 | 2 | 0 |
| 1982 | 4 | 0 |
| 1983 | 2 | 0 |
| 1984 | 10 | 0 |
| 1985 | 17 | 0 |
| 1986 | 8 | 0 |
| 1987 | 24 | 0 |
| 1988 | 14 | 0 |
| 1989 | 28 | 0 |
| 1990 | 17 | 0 |
| 1991 | 18 | 0 |
| 1992 | 21 | 0 |
| 1993 | 21 | 0 |
| 1994 | 24 | 0 |
| 1995 | 32 | 0 |
| 1996 | 29 | 0 |
| 1997 | 33 | 0 |
| 1998 | 43 | 0 |
| 1999 | 61 | 0 |
| 2000 | 52 | 0 |
| 2001 | 52 | 10 |
| 2002 | 57 | 53 |
| 2003 | 70 | 78 |
| 2004 | 68 | 73 |
| 2005 | 47 | 98 |
| 2006 | 71 | 90 |
| 2007 | 81 | 70 |
| 2008 | 59 | 78 |
| 2009 | 67 | 66 |
| 2010 | 67 | 47 |
| 2011 | 48 | 42 |
| 2012 | 35 | 21 |
| 2013 | 28 | 31 |
| 2014 | 35 | 44 |
| 2015 | 22 | 49 |
| 2016 | 44 | 38 |
| 2017 | 40 | 40 |
| 2018 | 45 | 40 |
| 2019 | 41 | 44 |
| 2020 | 66 | 69 |
| 2021 | 59 | 67 |
| 2022 | 55 | 67 |
| 2023 | 68 | 55 |
| 2024 | 53 | 70 |
| 2025 | 55 | 45 |
| 2026 | 28 | 24 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Solderless high current, high voltage, high bandwidth test fixture22 Sep 2026US 12,742,819 B2Keithley Instruments, LLC
- Test control device and operating method thereof8 Sep 2026US 12,730,152 B2Lite-On Technology Corporation
- Seamless universal verification methodology1 Sep 2026US 12,724,070 B1Amazon Technologies, Inc.
- Testing a control device using a test assembly25 Aug 2026US 12,716,946 B2dSPACE GmbH
- Testing large-scale electronic systems constituted of many functional blocks1 Oct 2026US 2026/0299023 A1Krivya Semicon Private Limited
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- Portable device and method for performing multiple tests on an electronic circuit20 Aug 2026US 2026/0243825 A1
- System and method for simulation of characteristic artificial intelligence (ai) load conditions30 Jul 2026US 2026/0219319 A1VERTIV INTERNATIONAL GmbH
- Method and system for correlating and filtering high-speed signal (hss) jitter with power supply ripple16 Jul 2026US 2026/0202470 A1Tektronix, Inc.
Most cited
By later US patents
- Method and apparatus for providing attribute nodes in a graphical data flow environment448US 5,481,741 ANational Instruments Corporation · 1996
- Graphical system for modelling a process and associated method373US 4,901,221 ANational Instruments Corporation · 1990
- System and method for dynamically controlling remote processes from a performance monitor343US 5,432,932 AInternational Business Machines Corporation · 1995
- Graphical system for modelling a process and associated method330US 4,914,568 ANational Instruments Corporation · 1990
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992