G01R 31/31915
In-circuit testers
Official title: {In-circuit Testers}
G01R31/31915 (In-circuit testers) appears on 78 US grants and 32 published applications in this corpus.
Search patents in G01R- Granted patents
- 78
- Published applications
- 32
- Assignees
- 48
- Inventors
- 190
- Latest grant
- 12 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 3 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 2 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 3 | 0 |
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 0 | 0 |
| 1999 | 5 | 0 |
| 2000 | 2 | 0 |
| 2001 | 3 | 1 |
| 2002 | 3 | 0 |
| 2003 | 2 | 2 |
| 2004 | 2 | 2 |
| 2005 | 0 | 0 |
| 2006 | 2 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 2 |
| 2011 | 1 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 2 |
| 2014 | 3 | 2 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 1 | 2 |
| 2019 | 2 | 0 |
| 2020 | 4 | 3 |
| 2021 | 2 | 2 |
| 2022 | 1 | 1 |
| 2023 | 2 | 3 |
| 2024 | 1 | 2 |
| 2025 | 1 | 2 |
| 2026 | 1 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Diagnostic ring oscillator circuit for DC and transient characterization12 May 2026US 12,625,180 B2Intel NDTM US LLC
- Diagnostic ring oscillator circuit for DC and transient characterization11 Nov 2025US 12,467,974 B2Intel NDTM US LLC
- Data recorder9 Apr 2024US 11,953,547 B2BAE Systems Controls Inc.
- Compiler-based code generation for post-silicon validation24 Oct 2023US 11,796,593 B2Synopsys, Inc.
- Controller structural testing with automated test vectors7 Mar 2023US 11,598,808 B2Micron Technology, Inc.
- Diagnostic ring oscillator circuit for dc and transient characterization5 Mar 2026US 2026/0063715 A1Intel NDTM US LLC
- Test device, test system, test method, and test apparatus19 Feb 2026US 2026/0050032 A1
- Test circuit and integrated circuit including the same14 Aug 2025US 2025/0258225 A1Samsung Electronics Co., Ltd.
- Forced early failure for memory device15 May 2025US 2025/0155493 A1SMART Modular Technologies, Inc.
- Improved diagnostic ring oscillator circuit for dc and transient characterization18 Jul 2024US 2024/0243735 A1Intel NDTM US LLC
Most cited
By later US patents
- Diagnostic system158US 5,357,519 AApple Computer, Inc. · 1994
- Synchronous memory test system118US 5,995,424 ATanisys Technology, Inc. · 1999
- Circuit-board tester with backdrive-based burst timing109US 6,175,230 B1GenRad, Inc. · 2001
- Network link tester device configured to selectively and automatically couple to a network transmit pair line or a node transmit pair line of a LAN port and determine available operational modes99US 6,434,716 B1Psiber Data Systems Inc. · 2002
- Synchronous memory tester87US 5,914,902 ATanisys Technology, Inc. · 1999