Compiler-based code generation for post-silicon validation
AssigneeSynopsys, Inc.
InventorsHillel Mendelson, Tom Kolan, Shay Aviv, Vitali Sokhin, Wesam Saleem Ibraheem
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Abstract
Embodiments relate to a system, program product, and method for integrating compiler-based testing in post-silicon validation. The method includes generating a test program through a device-under-test (DUT). The method also includes generating a plurality of memory intervals and injecting the plurality of memory intervals into the test program. The method further includes injecting a plurality of compiled test snippets into the test program and executing one or more post-silicon validation tests for the DUT with the test program.
Claims20
A computer system comprising:
- one or more processing devices configured to validate operation of a device-under-test (DUT) through post-silicon validation testing;
- one or more memory devices communicatively coupled to the one or more processing devices;
- and
- a compiler communicatively coupled to the one or more processing devices and the one or more memory devices, the one or more processing devices configured to:
- generate a test program through the DUT, comprising:
- generate a plurality of memory intervals;
- inject the plurality of memory intervals into the test program;
- inject, from the compiler, a plurality of compiled test snippets into the test program;
- and
- execute one or more post-silicon validation tests for the DUT with the test program.
A computer program product, comprising:
- one or more computer readable storage media;
- and
- program instructions collectively stored on the one or more computer storage media, the program instructions comprising:
- program instructions to execute one or more post-silicon validation tests for a device-under-test (DUT) comprising:
- program instructions to generate a test program through the DUT, comprising:
- program instructions to generate a plurality of memory intervals;
- program instructions to inject the plurality of memory intervals into the test program;
- program instructions to inject a plurality of compiled test snippets into the test program;
- and
- program instructions to execute one or more post-silicon validation tests for the DUT with the test program.
A computer-implemented method comprising:
- generating a test program through a device-under-test (DUT), comprising:
- generating a plurality of memory intervals;
- injecting the plurality of memory intervals into the test program;
- injecting a plurality of compiled test snippets into the test program;
- and
- executing one or more post-silicon validation tests for the DUT with the test program.
Dependencies are inferred from the claim text.