G01R 31/31908
Tester set-up
Official title: {Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns}
G01R31/31908 (Tester set-up) appears on 759 US grants and 536 published applications in this corpus.
Search patents in G01R- Granted patents
- 759
- Published applications
- 536
- Assignees
- 255
- Inventors
- 1,424
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 3 | 0 |
| 1979 | 2 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 0 | 0 |
| 1984 | 5 | 0 |
| 1985 | 9 | 0 |
| 1986 | 7 | 0 |
| 1987 | 16 | 0 |
| 1988 | 6 | 0 |
| 1989 | 16 | 0 |
| 1990 | 6 | 0 |
| 1991 | 8 | 0 |
| 1992 | 3 | 0 |
| 1993 | 11 | 0 |
| 1994 | 14 | 0 |
| 1995 | 15 | 0 |
| 1996 | 13 | 0 |
| 1997 | 15 | 0 |
| 1998 | 16 | 0 |
| 1999 | 33 | 0 |
| 2000 | 22 | 0 |
| 2001 | 26 | 3 |
| 2002 | 21 | 19 |
| 2003 | 23 | 18 |
| 2004 | 23 | 21 |
| 2005 | 11 | 26 |
| 2006 | 25 | 43 |
| 2007 | 29 | 27 |
| 2008 | 21 | 13 |
| 2009 | 25 | 18 |
| 2010 | 22 | 15 |
| 2011 | 13 | 11 |
| 2012 | 11 | 14 |
| 2013 | 8 | 18 |
| 2014 | 16 | 20 |
| 2015 | 13 | 30 |
| 2016 | 23 | 21 |
| 2017 | 20 | 19 |
| 2018 | 20 | 24 |
| 2019 | 18 | 15 |
| 2020 | 32 | 31 |
| 2021 | 27 | 30 |
| 2022 | 26 | 30 |
| 2023 | 23 | 19 |
| 2024 | 23 | 24 |
| 2025 | 24 | 21 |
| 2026 | 11 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Test control device and operating method thereof8 Sep 2026US 12,730,152 B2Lite-On Technology Corporation
- Automated test equipment and method using a trigger generation11 Aug 2026US 12,704,547 B2Advantest Corporation
- Delay measurement system and measurement method11 Aug 2026US 12,704,548 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Data simulation apparatus and data simulation method2 Jun 2026US 12,644,926 B2INSTITUTE OF SEMICONDUCTORS, CHINESE ACADEMY OF SCIENCES Beijing, China
- Testing large-scale electronic systems constituted of many functional blocks1 Oct 2026US 2026/0299023 A1Krivya Semicon Private Limited
- Substrate assembly with test interface to configure onboard circuitry16 Jul 2026US 2026/0202472 A1
- Composite system design for common mode error correction26 Mar 2026US 2026/0086150 A1Xcerra Corporation
- Comparator path loss compensation with attenuator12 Feb 2026US 2026/0043849 A1Analog Devices, Inc.
- Automatic reading and writing method of vehicular calibration signal and vehicle calibration method12 Feb 2026US 2026/0045125 A1Shanghai Tosun Technology Ltd.
Most cited
By later US patents
- Method of repairing integrated circuits165US 6,697,979 B1Pact Xpp Technologies AG · 2004
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Testing timing parameters of high speed integrated circuit devices129US 5,268,639 ARambus Inc. · 1993
- Timing adjustment circuit120US 5,589,788 AHewlett-Packard Company · 1996
- Weighted random pattern testing apparatus and method118US 4,801,870 AInternational Business Machines Corporation · 1989