Composite system design for common mode error correction

Abstract

In an aspect, a semiconductor device tester is disclosed. A semiconductor device tester may provide a device under test (DUT) in a semiconductor device testing system. A semiconductor device tester may apply a testing input signal from a test signal source circuitry to a DUT, the testing signal having a common mode error. A semiconductor device tester may determine, at a measurement unit connected to the test signal source circuitry, a voltage at an output signal to a DUT. A semiconductor device tester may communicate a voltage to a feedback subcircuit. A semiconductor device tester may provide, by a feedback subcircuit, a feedback signal to a testing signal to compensate for a common mode error.

Dependencies are inferred from the claim text.