G01R 31/3191
Calibration
Official title: {Calibration}
G01R31/3191 (Calibration) appears on 397 US grants and 271 published applications in this corpus.
Search patents in G01R- Granted patents
- 397
- Published applications
- 271
- Assignees
- 135
- Inventors
- 692
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 4 | 0 |
| 1986 | 1 | 0 |
| 1987 | 9 | 0 |
| 1988 | 2 | 0 |
| 1989 | 12 | 0 |
| 1990 | 4 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 8 | 0 |
| 1994 | 8 | 0 |
| 1995 | 7 | 0 |
| 1996 | 6 | 0 |
| 1997 | 8 | 0 |
| 1998 | 9 | 0 |
| 1999 | 13 | 0 |
| 2000 | 16 | 0 |
| 2001 | 14 | 3 |
| 2002 | 16 | 14 |
| 2003 | 18 | 16 |
| 2004 | 16 | 14 |
| 2005 | 8 | 18 |
| 2006 | 19 | 31 |
| 2007 | 22 | 16 |
| 2008 | 13 | 9 |
| 2009 | 14 | 9 |
| 2010 | 13 | 8 |
| 2011 | 7 | 1 |
| 2012 | 4 | 7 |
| 2013 | 2 | 7 |
| 2014 | 7 | 5 |
| 2015 | 7 | 17 |
| 2016 | 10 | 10 |
| 2017 | 10 | 14 |
| 2018 | 11 | 11 |
| 2019 | 11 | 9 |
| 2020 | 16 | 7 |
| 2021 | 9 | 12 |
| 2022 | 11 | 14 |
| 2023 | 8 | 7 |
| 2024 | 7 | 2 |
| 2025 | 7 | 5 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Delay measurement system and measurement method11 Aug 2026US 12,704,548 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Automatic calibration method and automatic calibration equipment for testing probe set used in semiconductor process31 Mar 2026US 12,591,032 B2United Microelectronics Corp.
- Multi-input remote heads for sequential testing17 Feb 2026US 12,553,943 B2Tektronix, Inc.
- Apparatus and method for removing fixture effect23 Dec 2025US 12,504,473 B2National Central University
- Multiplexer-enabled cables and test fixtures25 Nov 2025US 12,480,974 B2Tektronix, Inc.
- Substrate assembly with test interface to configure onboard circuitry16 Jul 2026US 2026/0202472 A1
- Composite system design for common mode error correction26 Mar 2026US 2026/0086150 A1Xcerra Corporation
- Comparator path loss compensation with attenuator12 Feb 2026US 2026/0043849 A1Analog Devices, Inc.
- Automatic reading and writing method of vehicular calibration signal and vehicle calibration method12 Feb 2026US 2026/0045125 A1Shanghai Tosun Technology Ltd.
- Test fixture, calibration setup and method of calibrating a test and/or measurement instrument1 Jan 2026US 2026/0003020 A1
Most cited
By later US patents
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Testing timing parameters of high speed integrated circuit devices129US 5,268,639 ARambus Inc. · 1993
- Timing adjustment circuit120US 5,589,788 AHewlett-Packard Company · 1996
- Remote test module for automatic test equipment105US 6,275,962 B1Teradyne, Inc. · 2001
- Method and apparatus for monitoring automated testing of electronic circuits103US 4,637,020 AFairchild Semiconductor Corporation · 1987