Multiplexer-enabled cables and test fixtures

A test and measurement system, comprising:

• a first port structured to electrically connect to a first signal lane of a device under test;
• a second port structured to electrically connect to a second signal lane of the device under test;
• a third port structured to electrically connect to a test and measurement instrument;
• a multiplexer configured to switch between electrically connecting the first port to the third port to provide a first signal path between the device under test and the test and measurement instrument and electrically connecting the second port to the third port to provide a second signal path between the device under test and the test and measurement instrument;
• an input configured to receive instructions to operate the multiplexer;
• and
• a memory structured to store one or more calibration parameters of the test and measurement system, wherein the one or more calibration parameters include at least one de-embed parameter, and wherein the one or more calibration parameters characterize the entire first signal path and the entire second signal path.

A method for connecting one or more signal lanes to a test and measurement instrument, comprising:

• connecting a first signal lane from a first port to the test and measurement instrument through a multiplexer within a test fixture;
• transmitting a first signal in a first signal path between the first signal lane and the test and measurement instrument through the multiplexer;
• switching the connection from the first signal lane to a second signal lane from a second port to the test and measurement instrument through the multiplexer;
• transmitting a second signal in a second signal path between the second signal lane and the test and measurement instrument through the multiplexer;
• retrieving one or more calibration parameters for the test fixture from a memory, wherein the one or more calibration parameters characterize the entire first signal path and the entire second signal path;
• and
• removing an effect of the test fixture from the first signal and the second signal using the one or more calibration parameters for the test fixture.