US 12,504,473 B2Granted

Apparatus and method for removing fixture effect

AssigneeNational Central University

InventorsJim-Wei Wu, Bo-Jun Chen, Shih-Hao Chien

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Abstract

An apparatus and method for removing fixture effect are disclosed herein. The device processes the calibration scattering parameters of the 2×-Thru calibration fixture pair through a time domain algorithm. The algorithm consists of time domain gating and ringing data processing to obtain partial S-parameters corresponding to the fixtures on each side of the 2×-Thru calibration fixture pair. The resulting scattering parameters are then substituted into the Mason's gain formula together with other known calibrated scattering parameters to determine all scattering parameters corresponding to the fixture on each side. Finally, in the de-embedding method, the S-parameters of the overall structure and the S-parameters of the fixtures on each side are used to obtain the scattering parameters of the DUT, thereby removing the fixture effect caused by the test fixture pair.

Claims18

Dependent claims

A fixture-effect removal device, comprising:

a storage, being configured to store a first set of scattering parameters (S-parameters) and a second set of S-parameters, wherein the first set of S-parameters is generated by a test device via testing a pair of two-time through (2×-Thru) calibration fixtures, and the second set of S-parameters is generated by the test device via testing a device under test (DUT) with a pair of test fixtures;
and
a processor, being electrically connected with the storage and configured to:
derive a first set of calibration S-parameters and a second set of calibration S-parameters from the first set of S-parameters through time-domain gating, ringing-data processing, and Mason's gain formula, thereby performing a fixture characterization of the first calibration fixture and the second calibration fixture, wherein the first set of calibration S-parameters corresponds to a first calibration fixture of the pair of 2×-Thru calibration fixtures, and the second set of calibration S-parameters corresponds to a second calibration fixture of the pair of 2×-Thru calibration fixtures, and
perform de-embedding processing according to the first set of calibration S-parameters, the second set of calibration S-parameters, and the second set of S-parameters, thereby generating a set of target S-parameters corresponding to the DUT only, and then removing a fixture effect caused by the pair of test fixtures.

2 more elements

A fixture-effect removal method, being executed by an electronic device, the electronic device storing a first set of scattering parameters (S-parameters) and a second set of S-parameters, the first set of S-parameters being generated by a test device via testing a pair of two-time through (2×-Thru) calibration fixtures, the second set of S-parameters being generated by the test device via testing a device under test (DUT) with a pair of test fixtures, the fixture-effect removal method comprising:

deriving a first set of calibration S-parameters and a second set of calibration S-parameters from the first set of S-parameters through time-domain gating, ringing-data processing, and Mason's gain formula, thereby performing a fixture characterization of the first calibration fixture and the second calibration fixture, wherein the first set of calibration S-parameters corresponds to a first calibration fixture of the pair of 2×-Thru calibration fixtures, and the second set of calibration S-parameters corresponds to a second calibration fixture of the pair of 2×-Thru calibration fixtures, and performing de-embedding processing according to the first set of calibration S-parameters, the second set of calibration S-parameters, and the second set of S-parameters, thereby generating a set of target S-parameters corresponding to the DUT only, and then removing a fixture effect caused by the pair of test fixtures.

Dependencies are inferred from the claim text.

Facts

Application: 18/605,760Filed 14 Mar 2024
Priority: TW 11214394114 Nov 2023
Published: US 2025/0155504 A115 May 2025
Granted: 23 Dec 2025
Term ends: Not estimatedThe source records don’t support an estimate.

Classification5 codes

G01R 27/28
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom: measuring attenuation, gain, phase…
G01R 31/3191
Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns: calibration
G01R 31/31905
Tester configuration: interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
G01R 35/005
Testing or calibrating of apparatus covered by the other groups of this subclass: calibrating; Standards or reference devices, e.g. voltage or…