Delay measurement system and measurement method
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShang Hsien Yang, Chung-Chieh Yang, Yung-Chow Peng, Chih-Chiang Chang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShang Hsien Yang, Chung-Chieh Yang, Yung-Chow Peng, Chih-Chiang Chang
Estimating the term…
A delay measurement system and a measurement method are provided. The delay measurement system includes a delay control device and a comparator. The delay control device is configured to generate a second signal in response to a first signal, wherein a rising edge of the second signal delays a first delay time with respect to a rising edge of the first signal, and the first delay time is controlled in response to an output signal of a comparator. The comparator is configured to compare the first delay time with a second delay time and output the output signal, wherein a rising edge of a third signal delays the second delay time with respect to the rising edge of the first signal, and the third signal is generated by a device under test (DUT) in response to the first signal.
A delay measurement system, comprising:
A delay measurement system, comprising:
A measurement method, comprising:
Dependencies are inferred from the claim text.