Testing large-scale electronic systems constituted of many functional blocks
AssigneeKrivya Semicon Private Limited
InventorKamlesh Kumar Sureshchandra Pandey
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AssigneeKrivya Semicon Private Limited
InventorKamlesh Kumar Sureshchandra Pandey
Estimating the term…
An electronic system with multiple functional blocks contains multiple slave units, with each functional block being connected to one of the slave units. The electronic system contains a master processor to receive test instructions and data units as a basis for multiple tests from a test equipment. The test equipment indicates a corresponding slave unit to which each test is directed to, and the master processor is designed to forward test instructions and each data unit corresponding to each of the multiple tests to a respective slave unit as indicated by the test equipment. Each slave unit is designed to execute the corresponding test(s) on the connected functional block.
An electronic system comprising:
A non-transitory machine-readable medium storing one or more sequences of instructions for testing of an electronic system comprising a plurality of functional blocks and a plurality of slave units, wherein each functional block is coupled to a corresponding slave unit for being tested, wherein execution of said one or more instructions by one or more processors contained in a test equipment cause said test equipment to perform the actions of:
Dependencies are inferred from the claim text.