G01R 31/31912
Tester/user interface
Official title: {Tester/user interface}
G01R31/31912 (Tester/user interface) appears on 195 US grants and 119 published applications in this corpus.
Search patents in G01R- Granted patents
- 195
- Published applications
- 119
- Assignees
- 88
- Inventors
- 421
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 2 | 0 |
| 1984 | 4 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 4 | 0 |
| 1988 | 0 | 0 |
| 1989 | 7 | 0 |
| 1990 | 6 | 0 |
| 1991 | 4 | 0 |
| 1992 | 5 | 0 |
| 1993 | 2 | 0 |
| 1994 | 4 | 0 |
| 1995 | 9 | 0 |
| 1996 | 8 | 0 |
| 1997 | 7 | 0 |
| 1998 | 11 | 0 |
| 1999 | 9 | 0 |
| 2000 | 5 | 0 |
| 2001 | 2 | 1 |
| 2002 | 8 | 6 |
| 2003 | 9 | 17 |
| 2004 | 11 | 8 |
| 2005 | 8 | 11 |
| 2006 | 10 | 10 |
| 2007 | 5 | 3 |
| 2008 | 3 | 9 |
| 2009 | 8 | 5 |
| 2010 | 2 | 1 |
| 2011 | 4 | 0 |
| 2012 | 3 | 1 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 3 |
| 2016 | 1 | 1 |
| 2017 | 0 | 0 |
| 2018 | 1 | 5 |
| 2019 | 5 | 7 |
| 2020 | 2 | 4 |
| 2021 | 7 | 6 |
| 2022 | 4 | 4 |
| 2023 | 4 | 2 |
| 2024 | 4 | 5 |
| 2025 | 2 | 4 |
| 2026 | 2 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Determining substrate characteristics by virtual substrate measurement4 Aug 2026US 12,699,824 B2APPLIED Materials.Inc.
- Electric component comparison apparatus, system, and related methods10 Feb 2026US 12,546,833 B2Coilcraft, Incorporated
- Electronic device testing system and method of use26 Aug 2025US 12,399,217 B1Blue Clover Design, LLC
- Method and system for controlling actions of testbench components within a test environment7 Jan 2025US 12,188,983 B1HCL America Inc.
- Electronic component testing system and time certification method5 Nov 2024US 12,135,350 B2Chroma Ate Inc.
- Portable device and method for performing multiple tests on an electronic circuit20 Aug 2026US 2026/0243825 A1
- Method and system for correlating and filtering high-speed signal (hss) jitter with power supply ripple16 Jul 2026US 2026/0202470 A1Tektronix, Inc.
- Automatic configuration of test system components7 May 2026US 2026/0126485 A1Toyota Jidosha Kabushiki Kaisha
- Ai enabled custom decoder generation for test and measurement instruments30 Apr 2026US 2026/0118426 A1Tektronix, Inc.
- Method for controlling a test and/or measurement system5 Mar 2026US 2026/0063672 A1Rohde & Schwarz GmbH & Co.KG
Most cited
By later US patents
- Method and apparatus for providing attribute nodes in a graphical data flow environment448US 5,481,741 ANational Instruments Corporation · 1996
- Graphical system for modelling a process and associated method373US 4,901,221 ANational Instruments Corporation · 1990
- System and method for dynamically controlling remote processes from a performance monitor343US 5,432,932 AInternational Business Machines Corporation · 1995
- Graphical system for modelling a process and associated method330US 4,914,568 ANational Instruments Corporation · 1990
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992