Electronic component testing system and time certification method
AssigneeChroma Ate Inc.
InventorsTzu-Ching Yang, Shih-Chao Lin
Life of this patent
Estimating the term…
Loading patent…
AssigneeChroma Ate Inc.
InventorsTzu-Ching Yang, Shih-Chao Lin
Estimating the term…
Herein disclosed are an electronic component testing system and a time certification method. The electronic component testing system comprising a testing device and an interface device. The testing device comprises a backboard, and the backboard electrically connected to at least one test board and comprising a time certification component. The interface device, electrically connected to the testing device, provides a test instruction. Wherein the time certification component stores an authorization start time and an authorization end time. Wherein the testing device starts a test procedure according to the test instruction, the time certification component updates the authorization start time to a first stop time of the test procedure after the test procedure is completed.
An electronic component testing system, comprising:
A time certification method, comprising:
Dependencies are inferred from the claim text.