Determining substrate characteristics by virtual substrate measurement

A system, comprising memory and a processing device coupled to the memory, wherein the processing device is to:

• receive feature data defining a plurality of features of a virtual substrate;
• prepare the virtual substrate for display on a graphical user interface (GUI);
• receive one or more first inputs via the GUI, wherein the one or more first inputs comprise one or more selected locations of the virtual substrate which are selected by user interaction with the virtual substrate displayed in one or more views via the GUI;
• define a three-dimensional measurement probe based on the one or more first inputs;
• and
• output a measurement of the measurement probe, wherein the measurement is associated with a characteristic of the virtual substrate measured by the three-dimensional measurement probe.

A non-transitory machine-readable storage medium storing instructions which, when executed, cause a processing device to perform operations comprising:

• receiving feature data defining a plurality of features of a virtual substrate;
• preparing the virtual substrate for display on a graphical user interface (GUI);
• receiving one or more first inputs via the GUI, wherein the one or more first inputs comprise one or more selected locations of the virtual substrate which are selected by user interaction with the virtual substrate displayed in one or more views via the GUI;
• defining a three-dimensional measurement probe based on the one or more first inputs;
• and
• outputting a measurement of the measurement probe, wherein the measurement is associated with characteristic of the virtual substrate measured by the three-dimensional measurement probe.