Method and system for correlating and filtering high-speed signal (hss) jitter with power supply ripple

A method of operating a test and measurement instrument, comprising:

• measuring a first ripple value of a power supply signal from a device under test (DUT);
• measuring a first periodic jitter (PJ) value of a high-speed signal from a load device coupled to receive the power supply signal from the DUT, wherein the high-speed signal is based on the power supply signal;
• determining a first time interval error (TIE) spectrum from the first PJ value;
• filtering the first TIE spectrum of the first PJ value to receive a second TIE spectrum corresponding to a second PJ value;
• determining a second ripple value by applying a jitter ratio based on the filtered PJ value and the actual PJ value and a noise factor to the first ripple value;
• and
• applying the second ripple value to the power supply signal.

A test and measurement instrument, comprising

• one or more test channels to connect to a device under test (DUT) and analyze signals generated by the DUT;
• and
• one or more processors configured to execute code to:
• acquire a power supply signal from a DUT and a high-speed signal from a load device, wherein the high-speed signal is based on the power supply signal, wherein the high-speed signal comprises jitter and the power supply signal comprises ripple;
• generate a vertical filter based on a frequency range of the high-speed signal, wherein the vertical filter is configured to vertically attenuate a peak magnitude in the frequency range by a reduction factor;
• apply the vertical filter to a time interval error (TIE) spectrum of the high-speed signal;
• and
• reconstruct a filtered power supply signal from a vertically-filtered high-speed signal based on the filtered TIE spectrum to correlate the jitter of the high-speed signal to the ripple of the power supply signal.