Solderless high current, high voltage, high bandwidth test fixture
AssigneeKeithley Instruments, LLC
InventorGregory Sobolewski
Life of this patent
Estimating the term…
Abstract
A test fixture for coupling a Device Under Test (DUT) to a measurement instrument includes a device interface board, which may be a solderless, press-fit board, for electrically connecting to one or more DUTs, a power delivery section electrically coupled to the device interface board through a series of electrical contacts, a measurement interface section electrically coupled to the device interface board through a second series of electrical contacts, the measurement interface structured to be coupled to the measurement instrument, and a metal plate coupled between and providing an electrical return path between the measurement interface and the power delivery section. The metal plate is sized and shaped to provide physical protection from DUTs that are destroyed during testing.
Claims20
A test fixture for coupling one or more Devices Under Test (DUTs) to a measurement instrument, the test fixture comprising:
- a device interface board for electrically connecting to the one or more DUTs;
- a power delivery section formed on a substrate and electrically coupled to the device interface board through a series of electrical contacts, the power delivery section having a first planar conductor on a first side of the substrate and a second planar conductor on a second side of the substrate opposite the first side, wherein the device interface board is coupled to the first planar conductor on the first side of the power delivery section;
- a measurement interface section electrically coupled to the device interface board through a second series of electrical contacts, the measurement interface section structured to be coupled to the measurement instrument;
- and
- a metal plate coupled between and providing an electrical return path between the measurement interface section and the power delivery section, wherein the metal plate is coupled to the second planar conductor on the second side of the power delivery section.
A test fixture for coupling one or more Devices Under Test (DUTs) to a measurement instrument, the test fixture comprising:
- a power delivery section formed on a substrate, the power delivery section configured to be coupled to an energy source for testing the one or more DUTs;
- a measurement interface section configured to be coupled to the measurement instrument;
- and
- a press-fit device interface board for electrically connecting to the one or more DUTs, the press-fit device interface board electrically coupled to the power delivery section and to the measurement interface section without solder by pressing a first planar conductor of the press-fit device interface board to a planar conductor of the power delivery section to form a first contact and by pressing a second planar conductor of the press-fit device interface board to a planar conductor of the measurement interface section to form a second contact.
Dependencies are inferred from the claim text.