G01R 31/3193
With comparison between actual response and known fault free response
Official title: with comparison between actual response and known fault free response {(receiver details G01R31/31924)}
G01R31/3193 (With comparison between actual response and known fault free response) appears on 1,022 US grants and 729 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,022
- Published applications
- 729
- Assignees
- 307
- Inventors
- 1,738
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 5 | 0 |
| 1978 | 2 | 0 |
| 1979 | 4 | 0 |
| 1980 | 3 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 4 | 0 |
| 1984 | 3 | 0 |
| 1985 | 8 | 0 |
| 1986 | 7 | 0 |
| 1987 | 19 | 0 |
| 1988 | 12 | 0 |
| 1989 | 15 | 0 |
| 1990 | 4 | 0 |
| 1991 | 8 | 0 |
| 1992 | 7 | 0 |
| 1993 | 11 | 0 |
| 1994 | 11 | 0 |
| 1995 | 18 | 0 |
| 1996 | 16 | 0 |
| 1997 | 24 | 0 |
| 1998 | 27 | 0 |
| 1999 | 29 | 0 |
| 2000 | 31 | 0 |
| 2001 | 35 | 13 |
| 2002 | 41 | 39 |
| 2003 | 53 | 56 |
| 2004 | 50 | 51 |
| 2005 | 39 | 55 |
| 2006 | 48 | 58 |
| 2007 | 42 | 43 |
| 2008 | 47 | 51 |
| 2009 | 36 | 40 |
| 2010 | 45 | 33 |
| 2011 | 32 | 21 |
| 2012 | 19 | 15 |
| 2013 | 22 | 10 |
| 2014 | 18 | 19 |
| 2015 | 18 | 14 |
| 2016 | 15 | 17 |
| 2017 | 10 | 16 |
| 2018 | 21 | 35 |
| 2019 | 30 | 12 |
| 2020 | 16 | 22 |
| 2021 | 25 | 22 |
| 2022 | 16 | 30 |
| 2023 | 25 | 11 |
| 2024 | 16 | 22 |
| 2025 | 20 | 14 |
| 2026 | 10 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Training method and test apparatus using the same1 Sep 2026US 12,724,068 B2Samsung Electronics Co., Ltd.
- Testing a control device using a test assembly25 Aug 2026US 12,716,946 B2dSPACE GmbH
- Configuring a fault-sensing ring oscillator circuit14 Jul 2026US 12,681,075 B2International Business Machines Corporation
- Test and/or measurement instrument for measuring an electrical signal16 Jun 2026US 12,656,396 B2Rohde & Schwarz GmbH & Co.KG
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- System and method for signal timing error correction3 Sep 2026US 2026/0259264 A1Rohde & Schwarz GmbH & Co.KG
- System and method for testing identical cores21 May 2026US 2026/0140178 A1NXP B. V.
- Electronic device and operation method therefor23 Apr 2026US 2026/0110734 A1LG Electronics Inc.
- Scandump simulation and co-simulation for device testing2 Apr 2026US 2026/0092965 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- System and method for comparing values from target systems419US 6,578,058 B1Agilent Technologies, Inc. · 2003
- Full wafer integrated circuit testing device306US 5,070,297 ATexas Instruments Incorporated · 1991
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Testing timing parameters of high speed integrated circuit devices129US 5,268,639 ARambus Inc. · 1993
- Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses119US 6,452,411 B1FormFactor, Inc. · 2002