G01R 31/31937
Timing aspects
Official title: {Timing aspects, e.g. measuring propagation delay (G01R31/3191 and G01R31/31922 take precedence; marginal testing G06F11/24)}
G01R31/31937 (Timing aspects) appears on 476 US grants and 362 published applications in this corpus.
Search patents in G01R- Granted patents
- 476
- Published applications
- 362
- Assignees
- 178
- Inventors
- 772
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 2 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 3 | 0 |
| 1986 | 3 | 0 |
| 1987 | 8 | 0 |
| 1988 | 4 | 0 |
| 1989 | 8 | 0 |
| 1990 | 1 | 0 |
| 1991 | 3 | 0 |
| 1992 | 4 | 0 |
| 1993 | 6 | 0 |
| 1994 | 4 | 0 |
| 1995 | 9 | 0 |
| 1996 | 7 | 0 |
| 1997 | 10 | 0 |
| 1998 | 8 | 0 |
| 1999 | 5 | 0 |
| 2000 | 9 | 0 |
| 2001 | 14 | 7 |
| 2002 | 23 | 21 |
| 2003 | 26 | 35 |
| 2004 | 34 | 34 |
| 2005 | 27 | 31 |
| 2006 | 26 | 37 |
| 2007 | 28 | 19 |
| 2008 | 25 | 26 |
| 2009 | 18 | 23 |
| 2010 | 26 | 16 |
| 2011 | 16 | 5 |
| 2012 | 5 | 4 |
| 2013 | 6 | 2 |
| 2014 | 5 | 3 |
| 2015 | 5 | 3 |
| 2016 | 3 | 6 |
| 2017 | 5 | 13 |
| 2018 | 15 | 27 |
| 2019 | 20 | 8 |
| 2020 | 6 | 8 |
| 2021 | 14 | 5 |
| 2022 | 5 | 12 |
| 2023 | 9 | 6 |
| 2024 | 5 | 7 |
| 2025 | 5 | 3 |
| 2026 | 6 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Die-to-die connectivity monitoring2 Jun 2026US 12,644,924 B2Proteantecs Ltd.
- System and method for signal timing error correction3 Sep 2026US 2026/0259264 A1Rohde & Schwarz GmbH & Co.KG
- Test and/or measurement instrument for measuring an electrical signal27 Nov 2025US 2025/0362344 A1Rohde & Schwarz GmbH & Co.KG
- Electronic device capable of sharing a memory and method for operating an electronic device to share a memory17 Jul 2025US 2025/0231237 A1Realtek Semiconductor Corp.
- Custom wrapper cell for hardware testing10 Jul 2025US 2025/0224446 A1Google Inc.
- Die-to-die connectivity monitoring28 Nov 2024US 2024/0393390 A1Proteantecs Ltd.
Most cited
By later US patents
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Testing timing parameters of high speed integrated circuit devices129US 5,268,639 ARambus Inc. · 1993
- System and method for adjusting a sampling time in a logic analyzer107US 6,463,392 B1Agilent Technologies, Inc. · 2002
- Method and apparatus for monitoring automated testing of electronic circuits103US 4,637,020 AFairchild Semiconductor Corporation · 1987
- Method of timing calibration using slower data rate pattern98US 6,735,709 B1Micron Technology, Inc. · 2004