G01R 31/31935
Storing data
Official title: {Storing data, e.g. failure memory}
G01R31/31935 (Storing data) appears on 226 US grants and 113 published applications in this corpus.
Search patents in G01R- Granted patents
- 226
- Published applications
- 113
- Assignees
- 107
- Inventors
- 445
- Latest grant
- 3 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 12 | 0 |
| 1988 | 7 | 0 |
| 1989 | 8 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 4 | 0 |
| 1996 | 6 | 0 |
| 1997 | 6 | 0 |
| 1998 | 10 | 0 |
| 1999 | 17 | 0 |
| 2000 | 13 | 0 |
| 2001 | 10 | 5 |
| 2002 | 9 | 6 |
| 2003 | 11 | 6 |
| 2004 | 6 | 3 |
| 2005 | 4 | 7 |
| 2006 | 4 | 4 |
| 2007 | 4 | 7 |
| 2008 | 5 | 5 |
| 2009 | 5 | 1 |
| 2010 | 5 | 3 |
| 2011 | 1 | 7 |
| 2012 | 3 | 3 |
| 2013 | 7 | 1 |
| 2014 | 4 | 7 |
| 2015 | 3 | 4 |
| 2016 | 5 | 5 |
| 2017 | 2 | 1 |
| 2018 | 2 | 3 |
| 2019 | 4 | 3 |
| 2020 | 0 | 4 |
| 2021 | 5 | 10 |
| 2022 | 7 | 8 |
| 2023 | 6 | 2 |
| 2024 | 5 | 5 |
| 2025 | 4 | 1 |
| 2026 | 1 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Debug data communication system for multiple chips3 Feb 2026US 12,540,971 B2Intel Corporation
- Semiconductor test apparatus using FPGA and memory control method for semiconductor test16 Dec 2025US 12,498,419 B2YC Corporation
- Semiconductor test apparatus capable of inducing reduction of power consumption11 Nov 2025US 12,469,579 B2YC Corporation
- Identifying failures in device cores4 Nov 2025US 12,461,141 B2Teradyne, Inc.
- Determination device, test system, and generation device1 Jul 2025US 12,345,765 B2Kioxia Corporation
- Method of using a test pattern for testing functionalities of external devices when an item is attached to a vehicle2 Apr 2026US 2026/0092970 A1Volvo Car Corporation
- Test device, test system, test method, and test apparatus19 Feb 2026US 2026/0050032 A1
- Semiconductor device and failure analysis method therefor25 Dec 2025US 2025/0389773 A1Renesas Electronics Corporation
- Identifying failures in device cores26 Sep 2024US 2024/0319261 A1Teradyne, Inc.
- Determination device, test system, and generation device11 Jul 2024US 2024/0230759 A9Kioxia Corporation
Most cited
By later US patents
- Full wafer integrated circuit testing device306US 5,070,297 ATexas Instruments Incorporated · 1991
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Method and apparatus for monitoring automated testing of electronic circuits103US 4,637,020 AFairchild Semiconductor Corporation · 1987
- Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card101US 5,497,079 AMatsushita Electric Industrial Co., Ltd. · 1996
- Method and apparatus for improved monitoring and detection of improper device operation95US 4,773,028 ATektronix, Inc. · 1988