G01R 31/31917
Stimuli generation or application of test patterns to the device under test
Official title: {Stimuli generation or application of test patterns to the device under test [DUT]}
G01R31/31917 (Stimuli generation or application of test patterns to the device under test) appears on 2,018 US grants and 1,519 published applications in this corpus.
Search patents in G01R- Granted patents
- 2,018
- Published applications
- 1,519
- Assignees
- 451
- Inventors
- 3,091
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 3 | 0 |
| 1978 | 5 | 0 |
| 1979 | 3 | 0 |
| 1980 | 5 | 0 |
| 1981 | 11 | 0 |
| 1982 | 9 | 0 |
| 1983 | 7 | 0 |
| 1984 | 6 | 0 |
| 1985 | 15 | 0 |
| 1986 | 13 | 0 |
| 1987 | 27 | 0 |
| 1988 | 22 | 0 |
| 1989 | 24 | 0 |
| 1990 | 11 | 0 |
| 1991 | 13 | 0 |
| 1992 | 23 | 0 |
| 1993 | 22 | 0 |
| 1994 | 26 | 0 |
| 1995 | 27 | 0 |
| 1996 | 30 | 0 |
| 1997 | 35 | 0 |
| 1998 | 48 | 0 |
| 1999 | 48 | 0 |
| 2000 | 56 | 0 |
| 2001 | 56 | 12 |
| 2002 | 75 | 71 |
| 2003 | 68 | 74 |
| 2004 | 66 | 88 |
| 2005 | 62 | 138 |
| 2006 | 108 | 121 |
| 2007 | 106 | 114 |
| 2008 | 101 | 110 |
| 2009 | 105 | 92 |
| 2010 | 98 | 72 |
| 2011 | 68 | 69 |
| 2012 | 53 | 36 |
| 2013 | 59 | 39 |
| 2014 | 50 | 45 |
| 2015 | 41 | 39 |
| 2016 | 36 | 29 |
| 2017 | 38 | 27 |
| 2018 | 30 | 34 |
| 2019 | 26 | 25 |
| 2020 | 42 | 47 |
| 2021 | 39 | 47 |
| 2022 | 47 | 47 |
| 2023 | 57 | 48 |
| 2024 | 42 | 36 |
| 2025 | 37 | 36 |
| 2026 | 17 | 23 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Test control device and operating method thereof8 Sep 2026US 12,730,152 B2Lite-On Technology Corporation
- Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support1 Sep 2026US 12,724,065 B1Synopsys, Inc.
- Semiconductor test apparatus and power supply method thereof1 Sep 2026US 12,724,067 B2Samsung Electronics Co., Ltd.
- Seamless universal verification methodology1 Sep 2026US 12,724,070 B1Amazon Technologies, Inc.
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- Common debug network for chiplet and multi-chipset architectures3 Sep 2026US 2026/0259259 A1QUALCOMM Incorporated
- Functional verification13 Aug 2026US 2026/0235671 A1Arm Limited
- Test time optimization for identical subsystems in soc13 Aug 2026US 2026/0235673 A1STMicroelectronics International N. V.
- Ir optimization technique of integrated circuit layout13 Aug 2026US 2026/0236656 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Differential signal transmission circuit244US 6,208,161 B1Advantest Corporation · 2001
- Method of and apparatus for multiplexed automatic testing of electronic circuits and the like199US 4,620,304 AGen Rad, Inc. · 1986
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Testing apparatus and method for thin film transistor display array128US 7,102,378 B2Primetech International Corporation · 2006
- Method for testing integrated devices119US 5,617,035 AMotorola, Inc. · 1997