Method for testing integrated devices
AssigneeMotorola, Inc.
InventorMavin C. Swapp
Life of this patent
Estimating the term…
Abstract
An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).
Claims13
A method of delivering an electrical signal to an integrated device, comprising the steps of:
- delivering an AC electrical signal to the integrated device, wherein the step of delivering an AC electrical signal comprises the steps of:
- applying a first voltage to a drive circuit;
- transmitting the first voltage to the integrated device;
- removing the first voltage;
- applying a second voltage to the drive circuit;
- and
- transmitting the second voltage to the integrated device;
- and
- delivering a DC electrical signal to the integrated device, wherein the step of delivering a DC electrical signal comprises the steps of:
- applying the DC electrical signal to the drive circuit;
- transmitting the DC electrical signal to the integrated device;
- and
- measuring a resulting DC electrical signal transmitted to the integrated device.
A method for delivering an electrical signal to an integrated device for characterizing the integrated device, comprising the steps of:
- determining an AC electrical timing parameter of the integrated device by:
- applying a first voltage to a drive circuit;
- transmitting the first voltage to the integrated device;
- using a voltage detector in cooperation with the first voltage to measure the AC electrical timing parameter;
- and
- removing the first voltage;
- and determining an output DC electrical signal by:
- applying an input DC electrical signal to the drive circuit;
- transmitting the input DC electrical signal to the integrated device;
- and
- measuring the output DC electrical signal.
Dependencies are inferred from the claim text.