G01R 31/31922
Timing generation or clock distribution
Official title: {Timing generation or clock distribution (G01R31/3191 takes precedence)}
G01R31/31922 (Timing generation or clock distribution) appears on 538 US grants and 365 published applications in this corpus.
Search patents in G01R- Granted patents
- 538
- Published applications
- 365
- Assignees
- 167
- Inventors
- 840
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 2 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 5 | 0 |
| 1986 | 1 | 0 |
| 1987 | 9 | 0 |
| 1988 | 5 | 0 |
| 1989 | 11 | 0 |
| 1990 | 4 | 0 |
| 1991 | 6 | 0 |
| 1992 | 6 | 0 |
| 1993 | 8 | 0 |
| 1994 | 11 | 0 |
| 1995 | 12 | 0 |
| 1996 | 13 | 0 |
| 1997 | 14 | 0 |
| 1998 | 16 | 0 |
| 1999 | 13 | 0 |
| 2000 | 18 | 0 |
| 2001 | 16 | 0 |
| 2002 | 16 | 20 |
| 2003 | 27 | 24 |
| 2004 | 17 | 19 |
| 2005 | 11 | 46 |
| 2006 | 38 | 38 |
| 2007 | 28 | 38 |
| 2008 | 32 | 30 |
| 2009 | 31 | 22 |
| 2010 | 30 | 21 |
| 2011 | 21 | 17 |
| 2012 | 11 | 9 |
| 2013 | 12 | 2 |
| 2014 | 9 | 2 |
| 2015 | 5 | 7 |
| 2016 | 4 | 5 |
| 2017 | 7 | 4 |
| 2018 | 5 | 6 |
| 2019 | 3 | 4 |
| 2020 | 8 | 14 |
| 2021 | 8 | 5 |
| 2022 | 15 | 8 |
| 2023 | 8 | 10 |
| 2024 | 8 | 2 |
| 2025 | 4 | 8 |
| 2026 | 4 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Delay measurement system and measurement method11 Aug 2026US 12,704,548 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Test and/or measurement system28 Apr 2026US 12,613,275 B2Rohde & Schwarz GmbH & Co.KG
- System and method for generating clock pulses for at-speed testing of integrated circuits17 Feb 2026US 12,553,946 B2NXP B. V.
- Analog phase selection test system4 Nov 2025US 12,461,146 B2NXP B. V.
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- Ir optimization technique of integrated circuit layout13 Aug 2026US 2026/0236656 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Non-destructive fault detecting method and system using debug access ports25 Jun 2026US 2026/0177612 A1
- Test circuit for reliability test of device under test and method for operating the same19 Feb 2026US 2026/0050035 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Signal separation device and signal separation method25 Dec 2025US 2025/0389772 A1Nanya Technology Corporation
Most cited
By later US patents
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Compensated delay locked loop timing vernier117US 5,684,421 ACredence Systems Corporation · 1997
- Programmable capacitance delay element having inverters controlled by adjustable voltage to offset temperature and voltage supply variations108US 5,283,631 AHewlett-Packard Company · 1994
- Method and apparatus for monitoring automated testing of electronic circuits103US 4,637,020 AFairchild Semiconductor Corporation · 1987
- Accurate alignment of clocks in mixed-signal tester92US 5,654,657 ASchlumberger Technologies, Inc. · 1997