Test and/or measurement system

A test and/or measurement system, the test and/or measurement system comprising:

• a first measurement circuit including a local oscillator (LO) circuit that is configured to generate an LO signal, a first signal distribution circuit, a first analog-to-digital converter (ADC), and a first LO port, wherein the first signal distribution circuit is configured to receive the LO signal and to forward the LO signal to the first LO port,
• a second measurement circuit including a second signal distribution circuit, a second ADC, and a second LO port,
• a processing circuit that is connected to both the first ADC and the second ADC,
• wherein the second LO port is connected to the first LO port so as to receive the LO signal from the first LO port, and wherein the second LO port is connected to the second signal distribution circuit such that the LO signal is forwarded from the second LO port to the second signal distribution circuit,
• wherein the test and/or measurement system has an adjustment mode, wherein, in the adjustment mode, the first signal distribution circuit is configured to forward the LO signal to the first ADC and the second signal distribution circuit is configured to forward the LO signal to the second ADC, wherein the first ADC is configured to digitize the LO signal, thereby obtaining a first digitized LO signal, wherein the second ADC is configured to digitize the LO signal, thereby obtaining a second digitized LO signal, and wherein the processing circuit is configured to receive the first digitized LO signal and the second digitized LO signal.