G01R 31/31924
Voltage or current aspects
Official title: {Voltage or current aspects, e.g. driver, receiver}
G01R31/31924 (Voltage or current aspects) appears on 558 US grants and 442 published applications in this corpus.
Search patents in G01R- Granted patents
- 558
- Published applications
- 442
- Assignees
- 205
- Inventors
- 903
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 4 | 0 |
| 1986 | 2 | 0 |
| 1987 | 9 | 0 |
| 1988 | 6 | 0 |
| 1989 | 5 | 0 |
| 1990 | 1 | 0 |
| 1991 | 4 | 0 |
| 1992 | 10 | 0 |
| 1993 | 5 | 0 |
| 1994 | 6 | 0 |
| 1995 | 9 | 0 |
| 1996 | 8 | 0 |
| 1997 | 7 | 0 |
| 1998 | 9 | 0 |
| 1999 | 11 | 0 |
| 2000 | 16 | 0 |
| 2001 | 18 | 2 |
| 2002 | 19 | 17 |
| 2003 | 11 | 17 |
| 2004 | 23 | 17 |
| 2005 | 15 | 32 |
| 2006 | 25 | 34 |
| 2007 | 27 | 32 |
| 2008 | 24 | 24 |
| 2009 | 34 | 34 |
| 2010 | 22 | 24 |
| 2011 | 18 | 11 |
| 2012 | 16 | 11 |
| 2013 | 19 | 18 |
| 2014 | 14 | 14 |
| 2015 | 16 | 11 |
| 2016 | 12 | 7 |
| 2017 | 9 | 9 |
| 2018 | 8 | 13 |
| 2019 | 8 | 10 |
| 2020 | 14 | 14 |
| 2021 | 14 | 19 |
| 2022 | 14 | 15 |
| 2023 | 21 | 18 |
| 2024 | 17 | 14 |
| 2025 | 15 | 12 |
| 2026 | 6 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test control device and operating method thereof8 Sep 2026US 12,730,152 B2Lite-On Technology Corporation
- Manufacturing automatic test equipment and field ambient comparison with silicon lifecycle management support1 Sep 2026US 12,724,065 B1Synopsys, Inc.
- Inspection device and electronic control device28 Jul 2026US 12,693,326 B2Denso Corporation
- Tester channel multiplexing in test equipment28 Apr 2026US 12,615,096 B2Yangtze Memory Technologies Co., Ltd.
- Failure insertion unit10 Feb 2026US 12,546,826 B2dSPACE GmbH
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- Ir optimization technique of integrated circuit layout13 Aug 2026US 2026/0236656 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor device, method of controlling semiconductor device and control program of semiconductor device30 Jul 2026US 2026/0219312 A1Renesas Electronics Corporation
- Substrate assembly with test interface to configure onboard circuitry16 Jul 2026US 2026/0202472 A1
- Power regulator monitoring circuit, power regulator system, and method of monitoring a power regulator23 Apr 2026US 2026/0110733 A1Infineon Technologies AG
Most cited
By later US patents
- Differential signal transmission circuit244US 6,208,161 B1Advantest Corporation · 2001
- Testing apparatus and method for thin film transistor display array128US 7,102,378 B2Primetech International Corporation · 2006
- Method for testing integrated devices119US 5,617,035 AMotorola, Inc. · 1997
- Integrated circuit test with programmable source for both AC and DC modes of operation112US 5,467,024 AMotorola, Inc. · 1995
- Circuit-board tester with backdrive-based burst timing109US 6,175,230 B1GenRad, Inc. · 2001