Integrated circuit test with programmable source for both AC and DC modes of operation
AssigneeMotorola, Inc.
InventorMavin C. Swapp
Life of this patent
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AssigneeMotorola, Inc.
InventorMavin C. Swapp
Estimating the term…
An integrated device test system (10, 40) having AC and DC measurement modes of operation comprises a drive circuit (11, 41), a programmable measurement unit (12) and a switch (18). The drive circuit (11, 41) may be a current mode drive circuit (11) or a voltage mode drive circuit (41). The drive circuit (11, 41) is coupled to the programmable measurement unit (12) and a device under test (64). In a DC mode of operation, the switch (18) is configured to couple a sense terminal (39) with one end of an isolation resistor (66). A second end of the isolation resistor (66) is connected to a pin (63) of the device under test (64). In an AC mode of operation, the switch (18) is configured to couple the sense terminal (39) with the drive circuit (11, 41) and the force terminal (35) of the programmable measurement unit (12).
A system for testing an integrated circuit device having AC and DC measurement modes of operation, comprising:
A test system having AC and DC measurement modes of operation, comprising:
A method of delivering an electrical signal to a device under test, comprising the steps of:
Dependencies are inferred from the claim text.