Testing apparatus and method for thin film transistor display array

A testing circuit for thin film transistor display array testing, use to test the yield of thin film transistor display array, comprising:

• An array tester, providing electrical power, testing signal wave-form, for analyzing, calculating, storing testing results;
• A device under test (DUT) platform, for holding the thin film transistor display array, and providing control signal to the platform and a sense amplifier by the array tester;
• A sense amplifier array, for transferring (discharge) the parasitic capacitance of the source line of the thin film transistors and integrating charge current of a pixel storage capacitor:
• wherein said sense amplifier array is composed by a plurality of trans-impedance amplifier units and a plurality of parasitic capacitance discharge circuits, the sense amplifier array including:
• A trans-impedance amplifier, is composed by a first operational amplifier, first switch, a second switch and a first operation capacitor;
• said first operation capacitor feed back the output of the first operational amplifier to the negative input of the first operational amplifier;
• the first switch connecting to the output and negative input of the first operational amplifier, to short circuit the first operation capacitor for discharge;
• the second switch to be the input switch, to connect or disconnect with the pixel storage capacitor;
• said trans-impedance amplifier forms an integrated circuit, the output of the first operational amplifier is transmitted to a sampling/hold circuit via an output switch and converted to a digital signal;
• A discharge circuit for the parasitic capacitance of the source line of the thin film transistors, composed by a second operational amplifier, third switch, a fourth switch and a second operation capacitor;
• said second operation capacitor feed back the output of the second operational amplifier to the negative input of the second operational amplifier;
• the third switch connecting to the output and negative input of the second operational amplifier, to short circuit the second operation capacitor for discharge;
• the fourth switch to be the input switch, to connect or disconnect with the parasitic capacitance of the source line of the thin film transistors;
• a load resistance connecting the output of the second operational amplifier to the ground;
• said discharge circuit forms a discharge route for the parasitic capacitance.