G01R 31/31926
Routing signals to or from the device under test [dut]
Official title: {Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing}
G01R31/31926 (Routing signals to or from the device under test [dut]) appears on 464 US grants and 375 published applications in this corpus.
Search patents in G01R- Granted patents
- 464
- Published applications
- 375
- Assignees
- 188
- Inventors
- 862
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 2 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 4 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 3 | 0 |
| 1987 | 9 | 0 |
| 1988 | 7 | 0 |
| 1989 | 6 | 0 |
| 1990 | 1 | 0 |
| 1991 | 3 | 0 |
| 1992 | 4 | 0 |
| 1993 | 4 | 0 |
| 1994 | 1 | 0 |
| 1995 | 7 | 0 |
| 1996 | 7 | 0 |
| 1997 | 5 | 0 |
| 1998 | 9 | 0 |
| 1999 | 10 | 0 |
| 2000 | 8 | 0 |
| 2001 | 9 | 4 |
| 2002 | 24 | 21 |
| 2003 | 16 | 24 |
| 2004 | 19 | 31 |
| 2005 | 27 | 34 |
| 2006 | 25 | 21 |
| 2007 | 29 | 29 |
| 2008 | 22 | 32 |
| 2009 | 19 | 15 |
| 2010 | 22 | 13 |
| 2011 | 11 | 17 |
| 2012 | 10 | 5 |
| 2013 | 17 | 11 |
| 2014 | 15 | 16 |
| 2015 | 11 | 11 |
| 2016 | 12 | 10 |
| 2017 | 11 | 6 |
| 2018 | 5 | 6 |
| 2019 | 6 | 2 |
| 2020 | 6 | 5 |
| 2021 | 6 | 17 |
| 2022 | 10 | 13 |
| 2023 | 12 | 4 |
| 2024 | 9 | 12 |
| 2025 | 9 | 12 |
| 2026 | 4 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor test apparatus and power supply method thereof1 Sep 2026US 12,724,067 B2Samsung Electronics Co., Ltd.
- System and method for schedule-based I/O multiplexing for integrated circuit (IC) scan test14 Jul 2026US 12,681,084 B1Marvell Asia Pte Ltd
- Streaming scan network latency balancing to reduce cost of testing identical replicated blocks2 Jun 2026US 12,645,623 B2QUALCOMM Incorporated
- Failure insertion unit10 Feb 2026US 12,546,826 B2dSPACE GmbH
- Multiplexer-enabled cables and test fixtures25 Nov 2025US 12,480,974 B2Tektronix, Inc.
- Systems and methods for multi-channel parallel device testing24 Sep 2026US 2026/0287657 A1Chroma Ate Inc.
- Common debug network for chiplet and multi-chipset architectures3 Sep 2026US 2026/0259259 A1QUALCOMM Incorporated
- Substrate assembly with test interface to configure onboard circuitry16 Jul 2026US 2026/0202472 A1
- Matrix Switching Workflow in a Test System for Device Testing25 Jun 2026US 2026/0177615 A1National Instruments Corporation
- Method for testing a counter, corresponding processing system and computer program product25 Dec 2025US 2025/0389771 A1STMicroelectronics International N. V.
Most cited
By later US patents
- Method of and apparatus for multiplexed automatic testing of electronic circuits and the like199US 4,620,304 AGen Rad, Inc. · 1986
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Method and apparatus for testing logic circuitry by applying a logical test pattern116US 5,072,178 AHitachi, Ltd. · 1991
- Distributed interface for parallel testing of multiple devices using a single tester channel107US 6,499,121 B1FormFactor, Inc. · 2002
- Method and apparatus for monitoring automated testing of electronic circuits103US 4,637,020 AFairchild Semiconductor Corporation · 1987