G01R 31/31816
Soft error testing
Official title: {Soft error testing; Soft error rate evaluation; Single event testing}
G01R31/31816 (Soft error testing) appears on 123 US grants and 114 published applications in this corpus.
Search patents in G01R- Granted patents
- 123
- Published applications
- 114
- Assignees
- 92
- Inventors
- 306
- Latest grant
- 13 Jan 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 3 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 5 |
| 2002 | 2 | 3 |
| 2003 | 2 | 1 |
| 2004 | 3 | 1 |
| 2005 | 3 | 4 |
| 2006 | 4 | 4 |
| 2007 | 2 | 4 |
| 2008 | 2 | 5 |
| 2009 | 5 | 4 |
| 2010 | 6 | 8 |
| 2011 | 5 | 4 |
| 2012 | 8 | 10 |
| 2013 | 10 | 4 |
| 2014 | 5 | 8 |
| 2015 | 7 | 3 |
| 2016 | 5 | 2 |
| 2017 | 4 | 6 |
| 2018 | 5 | 2 |
| 2019 | 4 | 5 |
| 2020 | 6 | 4 |
| 2021 | 3 | 8 |
| 2022 | 9 | 6 |
| 2023 | 5 | 5 |
| 2024 | 3 | 4 |
| 2025 | 2 | 3 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Physical security protection for integrated circuits13 Jan 2026US 12,524,580 B2Nordic Semiconductor ASA
- Test time reduction in circuits with redundancy flip-flops1 Apr 2025US 12,265,124 B1STMicroelectronics International N. V.
- Error protection analysis of an integrated circuit7 Jan 2025US 12,188,979 B2International Business Machines Corporation
- Nuclear reaction detection device, method and program3 Dec 2024US 12,158,552 B2National University Corporation Hokkaido University
- TVF transition coverage with self-test and production-test time reduction19 Nov 2024US 12,146,911 B1STMicroelectronics International N. V.
- Voltage glitch detection14 May 2026US 2026/0133250 A1NXP B. V.
- Identification of a fault in a finite state machine22 May 2025US 2025/0165333 A1
- Event detection system response controller27 Mar 2025US 2025/0102563 A1Raytheon Company
- Test time reduction in circuits with redundancy flip-flops27 Mar 2025US 2025/0102574 A1STMicroelectronics International N. V.
- Error protection analysis of an integrated circuit5 Dec 2024US 2024/0402246 A1International Business Machines Corporation
Most cited
By later US patents
- Conformationally constrained backbone cyclized somatostatin analogs62US 6,051,554 APeptor Limited · 2000
- Discrete placement of radiation sources on integrated circuit devices60US 7,649,257 B2International Business Machines Corporation · 2010
- Storage system comprising logical circuit configured in accordance with information in memory on PLD28US 7,325,179 B2Hitachi, Ltd. · 2008
- Error detecting circuit25US 7,188,284 B2Intel Corporation · 2007
- Logic built in self-test diagnostic method23US 5,930,270 AInternational Business Machines Corporation · 1999