G01R 31/31813
Test pattern generators
Official title: {Test pattern generators}
G01R31/31813 (Test pattern generators) appears on 374 US grants and 261 published applications in this corpus.
Search patents in G01R- Granted patents
- 374
- Published applications
- 261
- Assignees
- 168
- Inventors
- 683
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 3 | 0 |
| 1982 | 1 | 0 |
| 1983 | 3 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 4 | 0 |
| 1989 | 5 | 0 |
| 1990 | 4 | 0 |
| 1991 | 4 | 0 |
| 1992 | 3 | 0 |
| 1993 | 0 | 0 |
| 1994 | 4 | 0 |
| 1995 | 12 | 0 |
| 1996 | 5 | 0 |
| 1997 | 6 | 0 |
| 1998 | 14 | 0 |
| 1999 | 16 | 0 |
| 2000 | 12 | 0 |
| 2001 | 2 | 2 |
| 2002 | 11 | 13 |
| 2003 | 8 | 16 |
| 2004 | 15 | 10 |
| 2005 | 9 | 11 |
| 2006 | 11 | 27 |
| 2007 | 19 | 7 |
| 2008 | 19 | 18 |
| 2009 | 13 | 13 |
| 2010 | 18 | 7 |
| 2011 | 14 | 8 |
| 2012 | 7 | 1 |
| 2013 | 5 | 8 |
| 2014 | 4 | 3 |
| 2015 | 2 | 14 |
| 2016 | 11 | 8 |
| 2017 | 13 | 10 |
| 2018 | 9 | 6 |
| 2019 | 11 | 15 |
| 2020 | 8 | 4 |
| 2021 | 6 | 10 |
| 2022 | 15 | 16 |
| 2023 | 16 | 8 |
| 2024 | 12 | 6 |
| 2025 | 10 | 12 |
| 2026 | 3 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus29 Sep 2026US 12,748,144 B2Advantest Corporation
- Processor test pattern generation and application for tester systems26 May 2026US 12,638,501 B2Advantest Corporation
- GRPC-based chip test method, GRPC-based chip test apparatus, and storage medium10 Feb 2026US 12,546,822 B2Beijing ESWIN Computing Technology Co., Ltd.
- Low pin count scan with no dedicated scan enable pin25 Nov 2025US 12,480,993 B2STMicroelectronics International N. V.
- Test device and testing method for memory device18 Nov 2025US 12,474,405 B2Winbond Electronics Corp.
- Concurrent testing device and method for integrated circuit27 Aug 2026US 2026/0251707 A1Macrotest Semiconductor Technology Co., Ltd
- Modular data center installation, testing, measurement, and maintenance device6 Aug 2026US 2026/0227440 A1Viavi Solutions Inc.
- Hardware-based periodic self-testing of safety mechanisms6 Aug 2026US 2026/0227441 A1QUALCOMM Incorporated
- Test and measurement instrument with built-in advanced data pattern generator14 May 2026US 2026/0133226 A1Tektronix, Inc.
- Programmable logic built-in self-test (lbist) multiple input signature register (misr) for hardware enabled bist stored in separate memory30 Apr 2026US 2026/0118422 A1QUALCOMM Incorporated
Most cited
By later US patents
- Parallel decompressor and related methods and apparatuses152US 5,991,909 AMentor Graphics Corporation · 1999
- Parallel operation linear feedback shift register116US 5,412,665 AInternational Business Machines Corporation · 1995
- Decompressor/PRPG for applying pseudo-random and deterministic test patterns113US 6,684,358 B12004
- Methods and apparatus for generating pseudo-random binary patterns110US 5,446,683 AHewlett-Packard Company · 1995
- Bit error measurement system108US 5,761,216 AAdvantest Corporation · 1998