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US 2026/0133226 A1Published application
Test and measurement instrument with built-in advanced data pattern generator
AssigneeTektronix, Inc.
InventorsDananjeya Chetty, Jed H. Andrews
Life of this patent
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Abstract
A test and measurement instrument includes a display, one or more transmitters, one or more receivers, one or more channels configured to send and receive signals, a data pattern generator, and a high-speed serial trigger (HSST) circuit operating at 1 Gigabits per second or faster connected to the one or more receivers to receive data patterns from the data pattern generator to exercise the high-speed serial trigger circuit.
Claims26
A test and measurement instrument, comprising:
- a display;
- one or more transmitters;
- one or more receivers;
- one or more channels configured to send and receive signals;
- a data pattern generator;
- and
- a high-speed serial trigger (HSST) circuit operating at 1 Gigabits per second or faster connected to the one or more receivers to receive data patterns from the data pattern generator to exercise the high-speed serial trigger circuit.
4 more elements
A method of generating data patterns from a test and measurement instrument, comprising:
- displaying a user interface providing selections to allow a user to define a data pattern;
- receiving, through the user interface, a user-defined data pattern;
- generating a waveform from the user-defined data pattern;
- and
- selectively routing the waveform to at least one of an input channel of the test and measurement instrument and an external interface of the test and measurement instrument.
2 more elements
An oscilloscope, comprising:
- a display;
- one or more transmitters;
- one or more receivers;
- one or more channels configured to send and receive signals;
- a data pattern generator to generate a waveform from a user-defined data patter;
- and
- a path selector to selectively route the waveform to at least one of either an input channel of the oscilloscope and an external connector interface of the oscilloscope.
4 more elements
Dependencies are inferred from the claim text.