Source synchronous link integrity validation
AssigneeSun Microsystems, Inc.
InventorsBrian L. Smith, Prabhansu Chakrabarti
Life of this patent
Estimating the term…
Loading patent…
AssigneeSun Microsystems, Inc.
InventorsBrian L. Smith, Prabhansu Chakrabarti
Estimating the term…
A system may perform interconnect BIST (IBIST) testing on source synchronous links. The system may perform, at normal operating frequency, a source synchronous link test that tests a victim line on the source synchronous link using a transition weave pattern. The transition weave pattern causes interaction between a data transition on the victim line, previous transitions on the victim line, and transitions on the other lines of the link (the “aggressor” lines). The interaction caused may be: (i) a first crossing pulse on the victim line; (ii) a second crossing pulse of the opposite polarity on each aggressor line concurrent with the first crossing pulse on the victim line; and (iii) a reflection in the opposite direction of the first transition of the first crossing pulse, wherein the reflection results from a previous transition on the victim line.
A method comprising:
A method comprising:
A system comprising:
A system comprising:
Dependencies are inferred from the claim text.