I3C error states test strategy
AssigneeMicrochip Technology Incorporated
InventorVivek Viswanathan
Life of this patent
Estimating the term…
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AssigneeMicrochip Technology Incorporated
InventorVivek Viswanathan
Estimating the term…
An integrated circuit (IC) for testing an I3C device is provided. The IC may include a start/stop detection logic block to receive a serial data line (SDA) signal and a serial clock line (SCL) signal, and output a start detection signal and a stop detection signal, a SCL counter block to receive the SCL signal and the start and stop detection signals, and output a SCL count value, a SCL positive edge detection signal, and a SCL negative edge detection signal, a SDA inversion logic block to receive the SCL count value, a SCL programmed count value, and the SCL positive and negative edge detection signals, and output a SDA invert enable signal based on a comparison of the SCL count value and the SCL programmed count value, and a multiplexer to receive the SDA invert enable signal, and output the SDA signal or an inverted SDA signal.
An integrated circuit (IC) for testing an I3C device, the IC comprising:
A method for testing an I3C device, the method comprising:
Dependencies are inferred from the claim text.