G01R 31/3177
Testing of logic operation
Official title: Testing of logic operation, e.g. by logic analysers
G01R31/3177 (Testing of logic operation) appears on 2,077 US grants and 1,940 published applications in this corpus.
Search patents in G01R- Granted patents
- 2,077
- Published applications
- 1,940
- Assignees
- 329
- Inventors
- 2,358
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 3 | 0 |
| 1983 | 1 | 0 |
| 1984 | 4 | 0 |
| 1985 | 8 | 0 |
| 1986 | 2 | 0 |
| 1987 | 8 | 0 |
| 1988 | 5 | 0 |
| 1989 | 4 | 0 |
| 1990 | 7 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 3 | 0 |
| 1999 | 4 | 0 |
| 2000 | 12 | 0 |
| 2001 | 12 | 6 |
| 2002 | 12 | 14 |
| 2003 | 15 | 18 |
| 2004 | 18 | 20 |
| 2005 | 7 | 17 |
| 2006 | 20 | 28 |
| 2007 | 19 | 40 |
| 2008 | 30 | 37 |
| 2009 | 43 | 40 |
| 2010 | 44 | 62 |
| 2011 | 83 | 87 |
| 2012 | 71 | 77 |
| 2013 | 95 | 121 |
| 2014 | 95 | 124 |
| 2015 | 157 | 166 |
| 2016 | 150 | 173 |
| 2017 | 163 | 173 |
| 2018 | 159 | 134 |
| 2019 | 147 | 104 |
| 2020 | 133 | 100 |
| 2021 | 144 | 127 |
| 2022 | 110 | 87 |
| 2023 | 123 | 78 |
| 2024 | 74 | 45 |
| 2025 | 52 | 47 |
| 2026 | 21 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Low hold multi-bit flip-flop6 Oct 2026US 12,756,381 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Integrated circuit, memory device including the integrated circuit, and method of operating the same25 Aug 2026US 12,716,943 B2Samsung Electronics Co., Ltd.
- Integrated circuit including constant-0 flip flops reconfigured to provide observable and controllable test points25 Aug 2026US 12,716,944 B2QUALCOMM Incorporated
- Automated test equipment and method using a trigger generation11 Aug 2026US 12,704,547 B2Advantest Corporation
- Addressable test access port4 Aug 2026US 12,699,134 B2Texas Instruments Incorporated
- Configurable test circuit10 Sep 2026US 2026/0266903 A1Hewlett Packard Enterprise Development LP
- Self-test system for application-specific integrated circuit (asic) devices27 Aug 2026US 2026/0251709 A1Micron Technology, Inc.
- Method and system for testing three-dimensional semiconductor devices27 Aug 2026US 2026/0251710 A1Marvell Asia Pte Ltd
- Controlling testability of a true complement dynamic circuit6 Aug 2026US 2026/0227439 A1International Business Machines Corporation
- Adaptive fault injection facilitation systems, methods, and computer program products6 Aug 2026US 2026/0227958 A1IOActive Inc.
Most cited
By later US patents
- System and method for comparing values from target systems419US 6,578,058 B1Agilent Technologies, Inc. · 2003
- Work group computing for electronic design automation309US 5,983,277 AAltera Corporation · 1999
- Apparatus for at-speed testing, in inter-domain mode, of a multi-clock-domain digital integrated circuit according to BIST or SCAN techniques226US 8,862,955 B2STMicroelectronics S,r.l. · 2014
- Graphic editor for block diagram level design of circuits212US 6,110,223 AAltera Corporation · 2000
- Embedded logic analyzer for a programmable logic device158US 6,389,558 B1Altera Corporation · 2002