G01R 31/31702
Testing digital circuits including elements other than semiconductor transistors
Official title: {Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements}
G01R31/31702 (Testing digital circuits including elements other than semiconductor transistors) appears on 54 US grants and 34 published applications in this corpus.
Search patents in G01R- Granted patents
- 54
- Published applications
- 34
- Assignees
- 41
- Inventors
- 125
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 4 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 4 | 0 |
| 2000 | 3 | 0 |
| 2001 | 3 | 1 |
| 2002 | 1 | 1 |
| 2003 | 1 | 2 |
| 2004 | 1 | 0 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 2 |
| 2018 | 1 | 0 |
| 2019 | 1 | 4 |
| 2020 | 4 | 4 |
| 2021 | 5 | 6 |
| 2022 | 5 | 3 |
| 2023 | 2 | 3 |
| 2024 | 3 | 3 |
| 2025 | 3 | 2 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method of precharging a switchable filter8 Sep 2026US 12,732,162 B2Qm Technologies Aps
- 3D integrated circuit with enhanced debugging capability2 Sep 2025US 12,406,121 B2Xilinx, Inc.
- Systems and methods for on-chip noise measurements19 Aug 2025US 12,392,823 B2D-Wave Systems Inc.
- Detecting a function section in a representation of a quantum circuit11 Mar 2025US 12,248,020 B2Classiq Technologies Ltd.
- Test devices, test systems, and operating methods of test systems8 Oct 2024US 12,111,351 B2Samsung Electronics Co., Ltd.
- 3d integrated circuit with enhanced debugging capability25 Dec 2025US 2025/0390656 A1Xilinx, Inc.
- Detecting a Function Section in a Representation of a Quantum Circuit19 Jun 2025US 2025/0199064 A1Classiq Technologies Ltd.
- A method of precharging a switchable filter15 Aug 2024US 2024/0275364 A1Qdevil Aps
- Detecting a Function Section in a Representation of a Quantum Circuit8 Feb 2024US 2024/0044973 A1Classiq Technologies Ltd.
- 3d integrated circuit with enhanced debugging capability4 Jan 2024US 2024/0005074 A1Xilinx, Inc.
Most cited
By later US patents
- Built in self test with memory111US 5,764,655 AInternational Business Machines Corporation · 1998
- Method and apparatus for storage of test results within an integrated circuit73US 6,365,421 B2Micron Technology, Inc. · 2002
- JTAG component description via nonvolatile memory70US 5,325,368 ANCR Corporation · 1994
- Method and apparatus for storage of test results within an integrated circuit67US 6,194,738 B1Micron Technology, Inc. · 2001
- Integrated circuit fuse-link tester and test method40US 5,140,554 ATexas Instruments Incorporated · 1992