US 12,392,823 B2 · Systems and methods for on-chip noise measurements

Abstract

Systems and methods for measuring noise in discrete regions of multi-layer superconducting fabrication stacks are described. Methods for measuring noise in spatial regions of a superconducting fabrication stacks may include the use of resonators, each having a different geometry. As many resonators as spatial regions are fabricated. Data collected from the resonators may be used to calculate fill fractions and spin densities for different spatial regions of the superconducting fabrication stack. The data may be collected via on-chip electron-spin resonance. The superconducting fabrications may be part of a fabrication stack for a superconducting processor, for example a quantum processor, and the spatial region studied may be proximate to qubit wiring layers.

Claims18

Dependent claims

A method of conducting spatial noise measurements in a superconducting fabrication stack, the superconducting fabrication stack comprising one or more material interfaces, the method comprising:

identifying one or more spatial regions of the superconducting fabrication stack;
generating a plurality of resonator geometries;
fabricating a plurality of resonators on the superconducting fabrication stack, each resonator of the plurality of resonators having a respective one of the plurality of resonator geometries;
measuring data from the plurality of resonators;
calculating fill fractions for the one or more spatial regions of the superconducting fabrication stack based on electromagnetic (EM) field modeling and respective dimensions of each resonator geometry;
and
determining a spin density for each spatial region of the one or more spatial regions of the superconducting fabrication stack based on the data measured from the plurality of resonators and the calculated fill fractions.

4 more elements

A method of conducting spatial noise measurements in a superconducting fabrication stack, the superconducting fabrication stack comprising a plurality of resonators, each resonator having a different resonator geometry, and the superconducting fabrication stack comprising a plurality of spatial regions, the method executed by a digital processor and comprising:

measuring data from the plurality of resonators;
calculating fill fractions for each spatial region in the plurality of spatial regions of the superconducting fabrication stack based on electromagnetic (EM) field modeling and respective dimensions of each resonator geometry;
and
determining a spin density for each spatial region in the plurality of spatial regions of the superconducting fabrication stack based on the data measured from the plurality of resonators and the calculated fill fractions.

1 more element

Dependencies are inferred from the claim text.

Systems and methods for on-chip noise measurements

Life of this patent

Systems and methods for on-chip noise measurements

Life of this patent

Abstract

Claims18