G01R 31/31708
Analysis of signal quality
Official title: {Analysis of signal quality (G01R31/31901 takes precedence; measuring frequencies or analysing frequency spectra per se G01R23/00; measuring non-linear distortion per se G01R23/20)}
G01R31/31708 (Analysis of signal quality) appears on 752 US grants and 791 published applications in this corpus.
Search patents in G01R- Granted patents
- 752
- Published applications
- 791
- Assignees
- 283
- Inventors
- 1,390
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 4 |
| 2002 | 2 | 13 |
| 2003 | 13 | 19 |
| 2004 | 15 | 25 |
| 2005 | 14 | 51 |
| 2006 | 31 | 57 |
| 2007 | 52 | 67 |
| 2008 | 41 | 67 |
| 2009 | 53 | 63 |
| 2010 | 60 | 40 |
| 2011 | 50 | 26 |
| 2012 | 37 | 17 |
| 2013 | 29 | 15 |
| 2014 | 27 | 31 |
| 2015 | 28 | 18 |
| 2016 | 25 | 20 |
| 2017 | 23 | 27 |
| 2018 | 28 | 22 |
| 2019 | 21 | 32 |
| 2020 | 37 | 33 |
| 2021 | 20 | 34 |
| 2022 | 32 | 37 |
| 2023 | 41 | 25 |
| 2024 | 20 | 18 |
| 2025 | 21 | 20 |
| 2026 | 10 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Sub-sampled based instrument noise correction for jitter measurements8 Sep 2026US 12,730,146 B2Skyworks Solutions, Inc.
- Jitter applied detection for semiconductor secure element11 Aug 2026US 12,707,982 B2NXP B. V.
- Jitter measuring circuit, jitter analyzing apparatus including the same, and related methods of manufacturing semiconductor devices14 Jul 2026US 12,681,081 B2Samsung Electronics Co., Ltd.
- Test and/or measurement instrument for measuring an electrical signal16 Jun 2026US 12,656,396 B2Rohde & Schwarz GmbH & Co.KG
- Jitter injection generator for measuring phase noise and jitter transfer function7 Apr 2026US 12,596,148 B1NVIDIA Corporation
- Measurement application device, measurement application system, and method10 Sep 2026US 2026/0266902 A1Rohde & Schwarz GmbH & Co.KG
- Digital Glitch Sensor13 Aug 2026US 2026/0235672 A1Google Inc.
- Method and system for correlating and filtering high-speed signal (hss) jitter with power supply ripple16 Jul 2026US 2026/0202470 A1Tektronix, Inc.
- Multi-mode sensor, system-on-chip comprising the same and multi-mode sensing method thereof18 Jun 2026US 2026/0172012 A1Samsung Electronics Co., Ltd.
- Jitter injection generator for measuring phase noise and jitter transfer function9 Apr 2026US 2026/0098899 A1NVIDIA Corporation
Most cited
By later US patents
- Noise checking method and apparatus, and computer-readable recording medium in which noise checking program is stored194US 7,882,466 B2Fujitsu Limited · 2011
- Accurate alignment of clocks in mixed-signal tester92US 5,654,657 ASchlumberger Technologies, Inc. · 1997
- Method of establishing benchmark for figure of merit indicative of amplifier flicker noise82US 7,096,133 B1National Semiconductor Corporation · 2006
- IC testing apparatus74US 5,894,226 AAndo Electric Co., Ltd. · 1999
- Capturing and evaluating high speed data streams61US 6,694,462 B1Teradyne, Inc. · 2004