G01R 31/3171
Ber [bit error rate] test
Official title: {BER [Bit Error Rate] test}
G01R31/3171 (Ber [bit error rate] test) appears on 174 US grants and 160 published applications in this corpus.
Search patents in G01R- Granted patents
- 174
- Published applications
- 160
- Assignees
- 91
- Inventors
- 349
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 5 |
| 2003 | 2 | 6 |
| 2004 | 6 | 7 |
| 2005 | 7 | 8 |
| 2006 | 8 | 13 |
| 2007 | 11 | 10 |
| 2008 | 8 | 6 |
| 2009 | 8 | 8 |
| 2010 | 11 | 4 |
| 2011 | 10 | 7 |
| 2012 | 3 | 2 |
| 2013 | 6 | 2 |
| 2014 | 5 | 11 |
| 2015 | 6 | 7 |
| 2016 | 12 | 5 |
| 2017 | 8 | 5 |
| 2018 | 6 | 5 |
| 2019 | 5 | 7 |
| 2020 | 9 | 9 |
| 2021 | 7 | 7 |
| 2022 | 6 | 12 |
| 2023 | 10 | 3 |
| 2024 | 7 | 6 |
| 2025 | 9 | 4 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Bit-corrector circuits for photonic circuits with cascaded photonic gates10 Mar 2026US 12,571,843 B2Milkshake Technology Inc.
- Analyzing bit error data to determine a root cause of errors in a digital system3 Mar 2026US 12,566,656 B2EXFO Taiwan Inc.
- Error rate measurement apparatus and error rate measurement method14 Oct 2025US 12,442,856 B2Anritsu Corporation
- Error rate measurement apparatus and error rate measurement method14 Oct 2025US 12,442,857 B2Anritsu Corporation
- Fast stressed-eye calibration for receiving testing7 Oct 2025US 12,436,189 B2Tektronix, Inc.
- Measurement application device, measurement application system, and method10 Sep 2026US 2026/0266902 A1Rohde & Schwarz GmbH & Co.KG
- Independent Bit Error Rate Test Device28 Aug 2025US 2025/0274229 A1The United States of America as represented by the Secretary of the Navy
- System and method for solid state memory refresh22 May 2025US 2025/0166716 A1Pure Storage, Inc.
- Error rate measurement apparatus and error rate measurement method16 Jan 2025US 2025/0020717 A1Anritsu Corporation
- Error rate measurement apparatus and error rate measurement method16 Jan 2025US 2025/0020718 A1Anritsu Corporation
Most cited
By later US patents
- Built-in test scheme for a jitter tolerance test of a clock and data recovery unit44US 5,835,501 APMC-Sierra, Inc. · 1998
- System and method of processing a data signal40US 6,937,949 B1Finisar Corporation · 2005
- Bit error rate based wear leveling for solid state drive memory39US 8,832,506 B2International Business Machines Corporation · 2014
- Method and apparatus for estimating random jitter (RJ) and deterministic jitter (DJ) from bit error rate (BER)27US 7,246,274 B2Rambus Inc. · 2007
- Apparatus and method for spectrum analysis-based serial data jitter measurement20US 6,832,172 B2Tektronix, Inc. · 2004