Fast stressed-eye calibration for receiving testing
AssigneeTektronix, Inc.
InventorsSubhankar Ghose, Ankit Dash, David M. Bouse
Life of this patent
Estimating the term…
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AssigneeTektronix, Inc.
InventorsSubhankar Ghose, Ankit Dash, David M. Bouse
Estimating the term…
A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a second difference between a second dimension of the initial eye diagram and a second target dimension, estimating a next first value to cause the first difference to be zero, setting the first parameter to the next first value, generating a next eye diagram, repeating the estimating, setting, and generating until the first dimension of a most recent next eye diagram is within the first target dimension, setting a final first parameter value to a most recent next first value, setting a final second parameter value to the initial second value when the second dimension of the most recent next eye diagram is within the second target dimension, generating a calibration signal in accordance with the final first parameter value and the final second parameter value. A test and measurement device includes a user interface, at least one channel configured to connect to a device under test, a memory, and one or more processors configured to execute code to make the processors able to implement a process such as above.
A test and measurement device, comprising:
A method of generating a calibration signal, comprising:
Dependencies are inferred from the claim text.